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首页> 外文会议>International Conference on Advanced Diagnostics for Magnetic and Inertial Fusion, Sep 3-7, 2001, Varenna Italy >The Atomic K- and L-shell Ionization Cross-sections by Electron Impact
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The Atomic K- and L-shell Ionization Cross-sections by Electron Impact

机译：电子轰击的原子K和L壳电离截面

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摘要

The experimental and theoretical study of atomic inner-shell ionization cross-sections by electron impact, a subject of scientific study for many years, is important both for understanding the interaction between electrons and atoms and for technology application. The cross-section for the ionization of atoms and molecules by electron impact is one of the essential sets of data needed in a wide range of applications. For example, this can be used to the impurity diagnosis of magnetic fusion devices. It is well known that radiative cooling by low- and high-Z impurities accounts for a significant fraction of the power loss from tokamak plasmas. Several investigations have shown that the impurity radiation can seriously impair tokamak performance. The study of soft x-rays emitted between l-20keV has, therefore, increased in importance, furnishing electron temperature data and a wealth of impurity information.
机译：通过电子碰撞对原子内壳电离截面进行实验和理论研究是多年的科学研究课题，对于理解电子和原子之间的相互作用以及技术应用都具有重要意义。通过电子撞击使原子和分子电离的横截面是广泛应用中所需的基本数据集之一。例如，它可以用于磁聚变设备的杂质诊断。众所周知，低Z和高Z杂质的辐射冷却占了托卡马克等离子体功率损耗的很大一部分。多项研究表明，杂质辐射会严重损害托卡马克的性能。因此，对在1-20keV之间发射的软X射线的研究变得越来越重要，它提供了电子温度数据和大量的杂质信息。

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