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Shallow donors in GaN

机译:GaN中的浅施主

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摘要

High-resolution, variable temperature PL experiments were performed in the spectral region associated with recombination processes involving the ground and excited states of the neutral donor bound excitons. High-resolution infrared measurements in combination with high-sensitive SIMS unambiguously identified Si and O shallow donors and yield their ground state binding energies. These binding energies are in excellent agreement with values obtained by the analysis of the two-electron-satellite PL spectra considering the participation of ground and excited state donor bound excitons. This work clarifies conflicting aspects existing in donor identification and the binding energies of the impurities and excitons.
机译:在与涉及中性供体结合的激子的基态和激发态的重组过程相关的光谱区域中进行了高分辨率,可变温度的PL实验。高分辨率红外测量结合高灵敏度的SIMS可以明确识别出Si和O浅施主,并产生其基态结合能。考虑到基态和激发态供体结合的激子的参与,这些结合能与通过分析两个电子卫星PL光谱获得的值非常一致。这项工作澄清了供体鉴定中存在的矛盾方面以及杂质和激子的结合能。

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