Effects of the substrate on the determination of SEBS thin film mechanical properties by nanoindentation

机译：基板对纳米压痕法测定SEBS薄膜力学性能的影响

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In order to investigate nanoindentation data of polymer film-substrate systems and to learn more about the mechanical properties of polymer film-substrate systems, SEBS (styrene- ethylene/butylene-styrene) triblock copolymer thin film on different substrate systems have been tested with a systematic variation in penetration depth and substrate characteristics. Nanoindentation experiments were performed using a Hysitron Tribolndenter with a Berkvoich tip. The resulting data were analyzed in terms of load-displacement curves and various comparative parameters, such as hardness and Young's modulus. The results obtained by the Oliver and Pharr method show how the composite hardness and Young's modulus are different for different substrates and different penetration depth.

机译：为了研究聚合物薄膜-基底系统的纳米压痕数据并更多地了解聚合物薄膜-基底系统的机械性能，已经在不同基底系统上对SEBS（苯乙烯-乙烯/丁烯-苯乙烯）三嵌段共聚物薄膜进行了测试。穿透深度和基材特性的系统变化。纳米压痕实验使用具有Berkvoich尖端的Hysitron Tribolndenter进行。根据载荷-位移曲线和各种比较参数（例如硬度和杨氏模量）对所得数据进行了分析。通过Oliver和Pharr方法获得的结果表明，在不同的基材和不同的渗透深度下，复合材料的硬度和杨氏模量如何不同。

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来源
《International Conference on Precision Engineering and Micro/Nano Technology in Asia vol.2; 20051112-14; Shenzhen(CN)》|2005年|P.365-368|共4页
会议地点 Shenzhen(CN)
作者
Cao Yongzhi; Liang Yingchun; Dong Shen; Lu Ruilin;
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作者单位

Harbin Institute of Technology, Harhin, 150001,China;

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会议组织
原文格式 PDF
正文语种 eng
中图分类机械加工精度理论;
关键词
nanoindentation; mechanical property; SEBS thin film; substrate;

机译：纳米压痕;力学性能; SEBS薄膜;基底;

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专利

1. Effects of the Substrate on the Determination of SEBS Thin Film Mechanical Properties by Nanoindentation [J] . Y. Z. Cao, Y. C. Liang, S. Dong, Key Engineering Materials . 2006,第期

机译：基底对纳米压痕法测定SEBS薄膜力学性能的影响
2. Comment on: "Effects of the substrate on the determination of thin films mechanical properties by nanoindentation" by Saha and Nix [Acta Mater 2002;50:23] [J] . Ingomar L. Jager Scripta materialia . 2002,第6期

机译：评论：Saha和Nix的“基板对通过纳米压痕法测定薄膜机械性能的影响” [Acta Mater 2002; 50：23]
3. Corrigendum to 'Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness' [Mater. Sci. Eng. A 427 (2006) 232-240] [J] . Yifang Cao, Seyed Allameh, Derek Nankivil, Materials Science and Engineering . 2008,第1a2期

机译：《硅基板上多晶金和银薄膜的机械性能的纳米压痕测量：晶粒尺寸和膜厚的影响》更正。科学。 A 427（2006）232-240]
4. Effects of the Substrate on the Determination of SEBS Thin Film Mechanical Properties by Nanoindentation [C] . Y. Z. Cao, Y. C. Liang, S. Dong, Conference on Machining and Advanced Manufacturing Technology in China . 2006

机译：基材对纳米茚的测定SEBS薄膜力学性能的影响
5. Exploration of the origin of substrate effects and elastic strain properties during thin film nanoindentation. [D] . Zhou, Bo. 2009

机译：探索薄膜纳米压痕过程中基底效应和弹性应变特性的起源。
6. Scale effects of nanomechanical properties and deformation behavior of Au nanoparticle and thin film using depth sensing nanoindentation [O] . Dave Maharaj, Bharat Bhushan 2014

机译：深度感应纳米压痕法制备金纳米颗粒和薄膜的纳米力学性能和变形行为的尺度效应
7. Is the second harmonic method applicable for thin films mechanical properties characterization by nanoindentation? Is the second harmonic method applicable for thin films mechanical properties characterization by nanoindentation? [O] . Guillonneau, G, Kermouche, G, Teisseire, J, 2015

机译：二次谐波法适用于薄膜机械纳米压痕的特性表征？是二次谐波法适用于薄膜力学性能表征纳米压痕？
8. Critical issues in measuring the mechanical properties of hard films on soft substrates by nanoindentation techniques [R] . Hay, J. C. , Pharr, G. M. 1997

机译：用纳米压痕技术测量软基材上硬膜力学性能的关键问题

Effects of the substrate on the determination of SEBS thin film mechanical properties by nanoindentation

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