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Failure Analysis of Single Shared Column Fail in DRAM Using Nan -Probing Technique

机译:基于探测技术的DRAM单列失效分析。

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摘要

We report an analysis of a single shared column fail on rnDRAM technology using a nano-probing technique in this rnwork. The electrical characteristics of the failed transistors rnshow that the column fails were caused by twoid fferent rnfailure mechanisms abnormal contact and implant profiles. rnWe believe that electrical analysis using nano-probing will be rna powerful tool for non-visible failure analysisin the future rnbecause it is impossible to clearly reveal these two different rnfailure mechanisms solely using physical failure methods.
机译:我们报告了在此rnwork中使用纳米探测技术对rnDRAM技术的单个共享列失败的分析。发生故障的晶体管的电学特性表明,列故障是由双重传入故障机制,异常接触和注入轮廓引起的。我们认为,使用纳米探测进行电气分析将成为未来非可见故障分析的有力工具,因为不可能仅通过物理故障方法清楚地揭示这两种不同的故障机理。

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  • 会议地点 Portland OR(US);Portland OR(US)
  • 作者单位

    RD Division,Hynix Semiconductor Inc.rnSan 136-1 Ami-ri Bubal-eub Icheon-si Kyoungki-do 467-701 Korea rnTel) +82-31-639-1757 Fax) +82-31-639-0734 e-mail) sukmin.kim@hynix.com;

    RD Division,Hynix Semiconductor Inc. San 136-1 Ami-ri Bubal-eub Icheon-si Kyoungki-do 467-701 Korea;

    RD Division,Hynix Semiconductor Inc. San 136-1 Ami-ri Bubal-eub Icheon-si Kyoungki-do 467-701 Korea;

    RD Division,Hynix Semiconductor Inc. San 136-1 Ami-ri Bubal-eub Icheon-si Kyoungki-do 467-701 Korea;

    RD Division,Hynix Semiconductor Inc. San 136-1 Ami-ri Bubal-eub Icheon-si Kyoungki-do 467-701 Korea;

    RD Division,Hynix Semiconductor Inc. San 136-1 Ami-ri Bubal-eub Icheon-si Kyoungki-do 467-701 Korea;

    RD Division,Hynix Semiconductor Inc. San 136-1 Ami-ri Bubal-eub Icheon-si Kyoungki-do 467-701;

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  • 正文语种 eng
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