Improving Fault Isolation using Iterative Diagnosis

机译：使用迭代诊断改善故障隔离

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This paper presents an iterative diagnosis test generationrnframework to improve logic fault diagnosis resolution.rnIndustrial examples are presented in this paper on howrnadditional targeted pattern generation can be used tornimprove defect localization before physical failurernanalysis of a die. This enables failure analysts to be morerneffective by reducing the dependence on the morernexpensive physical fault isolation techniques.

机译：本文提出了一种迭代诊断测试生成框架，以提高逻辑故障诊断的分辨率。本文提供了一些工业示例，介绍了如何使用附加的目标模式生成来改善模具物理故障分析之前的缺陷定位。通过减少对更昂贵的物理故障隔离技术的依赖性，这使得故障分析人员可以更加有效。

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《ISTFA 2008 : Conference proceedings from the 34th international symposium for testing and failure analysis》|2008年|390-395|共6页
会议地点 Portland OR(US);Portland OR(US)
作者
Kevin Gearhardt; rnChris Schuermyer; rnRuifeng Guo;
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作者单位

LSI Logic CorporationrnFt.Collins,CO;

Mentor Graphics CorporationrnWilsonville,OR 97070;

Mentor Graphics CorporationrnWilsonville,OR 97070;

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正文语种 eng
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Improving Fault Isolation using Iterative Diagnosis

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