Wilmington Infrared Technol., Inc., Wilmington, DE, USA;
masks; semiconductor device measurement; temperature sensors; transistors; OEM; multiple-patterning; on-tool wafer temperature sensors; photomasks; processing tools; reaction equilibrium; reaction rates; semiconductor process conditions; temperature-related alignment budget loss; tool hardware; transistor length scale; Hardware; Plasma temperature; Semiconductor device measurement; Temperature distribution; Temperature measurement; Temperature sensors; Plasma; R2R; TEEMAP; Temperature; Viewport;
机译:使用压电晶片有源传感器检测复合材料在低温下的损伤
机译:通过第二代CoWoS技术进行高级逻辑存储系统的晶圆级集成
机译:晶体硅薄膜太阳能电池中用于高级光阱的倒置纳米金字塔阵列的晶圆级集成。
机译:先进的工具晶片温度传感器和集成
机译:用于结构健康监测的高温压电晶片有源传感器的开发和测试。
机译:全SiC电容式压力传感器常温下SiC-AlN的晶片键合
机译:用于三维晶片级集成的低温晶片键合