• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文会议>Joint 2015 e-Manufacturing amp; Design Collaboration Symposium 2015 and 2015 International Symposium on Semiconductor Manufacturing >I-fuse: A disruptive OTP technology for with excellent manufacturability
【24h】

I-fuse: A disruptive OTP technology for with excellent manufacturability

机译：智能保险丝：具有卓越可制造性的破坏性OTP技术

获取原文
获取原文并翻译 | 示例
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

I-fuse* is a disruptive fuse-based OTP technology based on true electromigration with excellent manufacturability. Conventional ways of programming a fuse is by applying a large current to break the fuse such that the program behavior is like an explosion. The debris created during the explosion may micro-bridge again and grow back to cause several reliability issues. By limiting the programming current below a catastrophic breaking point, the reliability of the I-fuse can be 100×. By using junction diode, instead of MOS, as program selector, the cell size can be only 1/100. By making fuse cells small to preserve heat better, the program current can be only 1/10 of the conventional electrical fuse (eFuse).
机译：I-fuse *是基于破坏性熔丝的OTP技术，基于真正的电迁移技术，具有出色的可制造性。对熔丝进行编程的常规方式是通过施加大电流来断开熔丝，使得编程行为像爆炸一样。爆炸过程中产生的碎屑可能会再次微桥接并重新长出，从而引起一些可靠性问题。通过将编程电流限制在灾难性的断裂点以下，I型保险丝的可靠性可以达到100倍。通过使用结二极管而不是MOS作为程序选择器，单元尺寸可以仅为1/100。通过使熔丝单元变小以更好地保持热量，编程电流可以仅为传统电熔丝（eFuse）的1/10。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号