首页> 外文会议> >Accelerated reliability testing for telecommunication systems using the highly accelerated life test (HALT) and highly accelerated stress screening (HAAS)

【24h】

Accelerated reliability testing for telecommunication systems using the highly accelerated life test (HALT) and highly accelerated stress screening (HAAS)

机译：使用高度加速寿命测试（HALT）和高度加速应力筛选（HAAS）的电信系统加速可靠性测试

获取原文

页面导航

著录项
相似文献
相关主题

著录项

来源
《》|2000年|P.49-53|共5页
会议地点
作者
Berger; H.;
展开▼
作者单位

展开▼
会议组织
原文格式 PDF
正文语种
中图分类无线电电子学、电信技术;
关键词
入库时间 2022-08-26 14:06:30

相似文献

外文文献
中文文献
专利

1. Acceleration of degradation by highly accelerated stress test and air-included highly accelerated stress test in crystalline silicon photovoltaic modules [J] . Suzuki Soh, Tanahashi Tadanori, Doi Takuya, Japanese journal of applied physics . 2016,第2期

机译：通过晶体硅光伏模块中的高加速应力测试和空气中的高加速应力测试加速降解
2. Highly Accelerated Life Test (HALT) Program at Space Systems Loral [J] . Brian Kosinski, Dennis Cronin Journal of the IEST . 2013,第speca期

机译：太空系统Loral的高度加速寿命测试（HALT）计划
3. Highly Accelerated Life Test (HALT) Program at Space Systems Loral [J] . Brian Kosinski, Dennis Cronin Journal of the IEST . 2013,第2期

机译：太空系统Loral的高度加速寿命测试（HALT）计划
4. Accelerated reliability testing for telecommunication systems using the highly accelerated life test (HALT) and highly accelerated stress screening (HAAS) [C] . Berger H., Institute of Electric and Electronic Engineer International Conference on Telecommunications Energy Special . 2000

机译：使用高度加速寿命测试（HALT）和高度加速应力筛选（HAAS）的电信系统加速可靠性测试
5. Optimal step-stress plans for accelerated life testing considering reliability/life prediction. [D] . Li, Chenhua. 2009

机译：考虑可靠性/寿命预测的加速寿命测试的最佳分步应力计划。
6. Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT) [O] . Ana María Hernández-López, Juan Antonio Aguilar-Garib, Sophie Guillemet-Fritsch, 2018

机译：X7R多层陶瓷电容器在高加速寿命测试（HALT）期间的可靠性
7. Analysis the Reliability of Multilayer Ceramic Capacitor with inner Ni Electrode under highly Accelerated Life Test Conditions [O] . Jung-Rag Yoon, Kyung-Min Lee, Serk-Won Lee 2009

机译：高加速寿命试验条件下内Ni电极的多层陶瓷电容器的可靠性

Accelerated reliability testing for telecommunication systems using the highly accelerated life test (HALT) and highly accelerated stress screening (HAAS)

著录项

相似文献

相关主题

期刊订阅