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Theorems of parameter variations applied for the extraction of compact models of on-chip passive structures

机译：参数变化定理用于片上无源结构紧凑模型的提取

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The paper presents and proves a series of theorems related to parameter variations in passive circuits. They are applied for the studying of appropriate boundary conditions for field problems formulated in the lumped parameter extraction in passive on-chip structures. The proposed method provides not only effective "open" boundary conditions, but also a method to control the accuracy of the numerical solution obtained with FIT.

机译：本文提出并证明了与无源电路中的参数变化相关的一系列定理。它们适用于研究在芯片结构中集体参数提取中配制的现场问题的适当边界条件。该方法不仅提供有效的“开放”边界条件，还提供了一种控制用拟合获得的数值溶液的精度的方法。

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《》|2005年|P.147-150|共4页
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Ioan; D.; Ciuprina; G.; Radulescu; M.;
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中图分类工业技术;
关键词
VLSI; boundary-value problems; integrated circuit modelling; lumped parameter networks; network analysis; passive networks; FIT; boundary conditions; lumped parameter extraction; on chip passive structures; passive circuits;

机译：VLSI;边值问题;集成电路建模;集总参数网络;网络分析;无源网络; FIT;边界条件;集总参数提取;片上无源结构;无源电路;

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2. GPGPU accelerated Krylov methods for compact modeling of on-chip passive integrated structures within the Chameleon-RF workflow [J] . Sebastian Gim Egyptian Informatics Journal . 2012,第3期

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3. Absorbing boundary conditions for compact modeling of on-chip passive structures [J] . Daniel Ioan, Gabriela Ciuprina, Marius Radulescu Compel . 2006,第3期

机译：吸收边界条件，用于片上无源结构的紧凑建模
4. Theorems of parameter variations applied for the extraction of compact models of on-chip passive structures [C] . Ioan D., Ciuprina G., Radulescu M. International Symposium on Signals, Circuits and Systems . 2005

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Theorems of parameter variations applied for the extraction of compact models of on-chip passive structures

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