首页> 外文会议>European photovoltaic solar energy conference >A NOVEL LINEAR RF SOURCE FOR PECVD OF THIN-FILM SILICON
【24h】

A NOVEL LINEAR RF SOURCE FOR PECVD OF THIN-FILM SILICON

机译:薄膜硅PECVD的新型线性RF源

获取原文

摘要

We present a new linear RF source for plasma enhanced CVD of amorphous and microcrystallinesilicon. The source has been developed for application in continuous, roll-to-roll deposition of doped silicon layers, aspart of a system in which the intrinsic silicon layers will be made by high-rate microwave PECVD. Plasma analysis,by Langmuir probing and by Retarding Field Analysis, shows that the plasma is homogeneous within ± 3% over theentire width of the source, and that the energies of ions arriving at the substrate are lower than 10 eV. The width ofthe deposition regime in this case is 30 cm, but the sources can be extended to achieve homogeneous deposition overwidths of more than 1 m. The source is well suited for deposition of amorphous and microcrystalline silicon, and thetransition from microcrystalline growth to amorphous growth occurs for SiH_4/H_2 flow ratios between 0.05 and 0.01.
机译:我们提出了一种新的线性射频源,用于非晶和微晶的等离子体增强CVD 硅。该源已被开发用于连续,卷对卷的掺杂硅层沉积,例如: 系统的一部分,其中本征硅层将通过高速微波PECVD制成。血浆分析 Langmuir探测和缓速场分析的结果表明,等离子体的均匀度在±3%范围内。 源的整个宽度,以及到达基板的离子的能量低于10 eV。宽度 在这种情况下,沉积方式为30厘米,但是可以扩展源,以在 宽度超过1 m。该源非常适合于沉积非晶硅和微晶硅,并且 SiH_4 / H_2流量比介于0.05和0.01之间时,会发生从微晶生长到非晶生长的转变。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号