Wavelet transform domain adaptive clustering for electronic product quality inspection

机译：小波变换域自适应聚类在电子产品质量检测中的应用

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摘要

Wavelet transform (WT) domain adaptive clustering for electronic product quality inspection was suggested in this work. The proposed information technology, based on the multistart adaptive clustering method in the space of the WT, can shorten manufacturing test of products in case of a significant change in these parameters over time, a high noise level and small samples of data.

机译：在这项工作中提出了用于电子产品质量检查的小波变换（WT）域自适应聚类。所提出的信息技术基于WT空间中的多启动自适应聚类方法，可以在这些参数随时间发生重大变化，高噪声水平和少量数据样本的情况下，缩短产品的制造测试。

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《International Conference on Intelligent Data Acquisition and Advanced Computing Systems》|2013年|153-156|共4页
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Shcherbakova Galina; Krylov Viktor; Pisarenko Radmila; Kuzmenko Vadym;
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clustering; sub gradient; wavelet transfor domain;

机译：聚类;亚梯度;小波变换域;

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4. Wavelet transform domain adaptive clustering for electronic product quality inspection [C] . Shcherbakova Galina, Krylov Viktor, Pisarenko Radmila, International Conference on Intelligent Data Acquisition and Advanced Computing Systems . 2013

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8. Adaptive Filtering in the Wavelet Transform Domain Via Genetic Algorithms [R] . Moore, F. , Marshall, P. , Balster, E. 2004

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Wavelet transform domain adaptive clustering for electronic product quality inspection

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