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Zinc Oxide nanowire transistor nonvolatile memory with a ferroelectric polymer interlayer

机译:氧化锌纳米线晶体管非易失性存储器,具有铁电聚合物中间层

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A ferroelectric polymer memory device based on a top-gated Zinc Oxide (ZnO) nanowire (NW) field-effect transistor (FET) have been fabricated using room temperature process, where the nanowire semiconductor channel was coated with a poly(vinylidene fluoride-trifluoroethylene) [P(VDF-TrFE)] layer. The fabricated test device showed excellent properties, with a 5V wide memory window at VG<20V, high On/Off ratio >105 and low gate leakage current <10−12A. Memory effect was verified by the counterclockwise direction of the transfer curve hysteresis of the FET devices, due to the fact that memory window is ascribable to the switchable remnant polarization. This result is an actual demonstration of the memory application which built on nanowire devices.
机译:使用室温工艺制造了一种基于顶栅氧化锌(ZnO)纳米线(NW)场效应晶体管(FET)的铁电聚合物存储器件,其中纳米线半导体通道用聚(偏二氟乙烯 - 三氟乙烯涂覆)[P(VDF-TRFE)]层。制造的测试装置显示出优异的性能,Vg <20V的5V宽内存窗口,高开/关比> 10 5 和低栅极漏电流<10 -12 一种。由于存储器窗口归名可切换残余偏振,因此通过FET器件的传输曲线滞后的逆时针方向验证了记忆效果。该结果是基于纳米线器件上的存储器应用的实际演示。

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