PIN sensor array response to heavy-ion particles in bulk and SOI technologies

机译：引脚传感器阵列对散装和SOI技术中重离子颗粒的响应

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The PIN sensor array in two technologies (bulk and SOI) is studied here, based on fabricated lateral PIN. Experimental data in non-radiation environment is used to adjust the models implemented in the numerical simulator that are latter used to evaluate the radiation analysis for heavy-ion particles. Near-Earth natural environment is composed of energetic protons, electrons, and heavy-ions coming from galactic cosmic ray and solar events. Radiation sensors come as a vital part to study and monitor energetic particles in radiation environments.

机译：这里研究了两种技术（散装和SOI）中的引脚传感器阵列，基于制造的横向销。非辐射环境中的实验数据用于调整在数值模拟器中实现的模型，该模拟器用于评估重离子颗粒的辐射分析。近地球自然环境由来自银河宇宙射线和太阳能赛的能量质子，电子和重型的重型。辐射传感器作为在辐射环境中研究和监测能量颗粒的重要组成部分。

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《Symposium on Microelectronics Technology and Devices》|2017年|1 v.|共4页
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作者
R. T. Bühler; E. T. Cansio; A. L. Perin; C. D. Novo; M. A. G. Silveira; R. C. Giacomini;
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正文语种
中图分类微电子学、集成电路（IC）;
关键词
Cathodes; Pins; Anodes; Substrates; Sensor arrays; PIN photodiodes; Transient analysis;

机译：阴极;引脚;阳极;基板;传感器阵列;PIN光电二极管;瞬态分析;

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专利

1. Angular Effects of Heavy-Ion Induced Single-Event Upset Response for Flip-Chip Packaged SRAM Device in 14 nm Bulk FinFET Technology [J] . Mo Lihua, Liu Jie, Zhang Zhangang, 中国科学院近代物理研究所和兰州重离子研究装置年报：英文版 . 2018,第001期

机译：14 nm散装FinFET技术中倒装芯片封装SRAM装置的重离子诱导单事件镦锻响应的角度效应
2. Angular Effects of Heavy-Ion Strikes on Single-Event Upset Response of Flip-Flop Designs in 16-nm Bulk FinFET Technology [J] . Hangfang Zhang, Hui Jiang, Thiago R. Assis, Nuclear Science, IEEE Transactions on . 2017,第1期

机译：重离子轰击对16nm体FinFET技术中触发器设计的单事件翻转响应的角度影响
3. Insights on the transient response of fully and partially depleted SOI technologies under heavy-ion and dose-rate irradiations [J] . Ferlet-Cavrois V., Gasiot G., Marcandella C., IEEE Transactions on Nuclear Science . 2002,第6期

机译：对重离子和剂量率辐照下完全耗尽和部分耗尽的SOI技术的瞬态响应的见解
4. PIN sensor array response to heavy-ion particles in bulk and SOI technologies [C] . R. T. Bühler, E. T. Cansio, A. L. Perin, 2017 32nd Symposium on Microelectronics Technology and Devices . 2017

机译：PIN传感器阵列对大体积离子粒子和SOI技术的响应
5. High gain CMOS image sensor design and fabrication on SOI and bulk technology. [D] . Zhang, Weiquan. 2000

机译：基于SOI和批量技术的高增益CMOS图像传感器设计与制造。
6. How do changes in bulk soil organic carbon content affect carbon concentrations in individual soil particle fractions? [O] . X. M. Yang, C. F. Drury, W. D. Reynolds, -1

机译：散装土壤有机碳含量的变化如何影响单个土壤颗粒部分中的碳浓度？
7. II. Early Loblolly Pine Stand Response to Tillage on the Piedmont and Upper Coastal Plain of Georgia: Tree Allometry, Foliar Nitrogen Concentration, Soil Bulk Density, Soil Moisture, and Soil Nitrogen Status [O] . R.E. Will, M.J. Wheeler, D. Markewitz, 2002

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PIN sensor array response to heavy-ion particles in bulk and SOI technologies

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