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首页> 外文会议>IEEE International Midwest Symposium on Circuits and Systems >Self-Correcting, Self-Testing Circuits and Systems for Post-Manufacturing Yield Improvement
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Self-Correcting, Self-Testing Circuits and Systems for Post-Manufacturing Yield Improvement

机译：制造后产量改进的自校正，自校准电路和系统

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摘要

This paper presents a self-correcting and self-testing approaches for post manufacturing yield improvement of RF circuits embedded in the RF systems. In the proposed approaches, the test signature is self-generated from the Device-Under-Test (DUT) with the help of some additional circuitry. This self-generated test signature is analyzed by using on-chip resources for testing and controlling the DUT's calibration knobs to compensate for multi-parameter variations in the manufacturing process. Thus, the proposed approaches enable the self-healing (self-test and self-correction) for parametric defects in the DUT. This paper also presents the calibration algorithm based on performance curves, which enables the tuning of the DUT's calibration knobs for the yield improvement after the testing of the DUT is performed. Although this calibration algorithm is demonstrated for the healing of RF amplifier and RF mixer, this algorithm can also be used for other kind of circuits as well. The proposed approaches are demonstrated by simulations results of an RF amplifier and RF mixer. The hardware prototype of the self-healing RF LNA is also presented.
机译：本文提出了一种自我校正和自我测试方法，用于制造嵌入RF系统中的RF电路的生产率改进。在提出的方法中，在一些附加电路的帮助下，测试签名是从设备欠测试（DUT）自我产生的。通过使用片上资源来进行测试和控制DUT的校准旋钮来分析这种自生成的测试签名，以补偿制造过程中的多参数变化。因此，所提出的方法能够为DUT中的参数缺陷进行自我愈合（自检和自我校正）。本文还介绍了基于性能曲线的校准算法，可以在执行DUT测试后调整DUT的校准旋钮，以便在执行该DUT测试后的收益率。尽管该校准算法用于RF放大器和RF混合器的愈合，但也可以用于其他类型的电路。通过RF放大器和RF混合器的模拟结果证明了所提出的方法。还提出了自我愈合的RF LNA的硬件原型。

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