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3-D simulation of charge collection in double-gate MOSFET under low-energy proton irradiation

机译:低能质子辐照下双栅MOSFET电荷收集的3-D模拟

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The charge collection in 20 nm double-gate MOSFET (DG MOSFET) submitted to low-energy Proton irradiation are investigated in this paper. The drain current transient and charge collection with different doping levels are simulated. Different strike radii and locations are also discussed in the paper.
机译:本文研究了低能质子辐照在20 nm双栅MOSFET(DG MOSFET)中的电荷收集情况。模拟了不同掺杂水平的漏极电流瞬态和电荷收集。本文还讨论了不同的打击半径和位置。

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