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Optical proximity correction for super-resolution technique

机译:光学接近度校正,用于超分辨率技术

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Abstract: In order to support next generation ULSI devices, some super resolution techniques are developed. The super resolution technique is effective for smaller pattern but not for larger pattern. This is because the optimum dose is changed, due to the pattern characteristic. However, the z-image profile has sufficient focus latitude. To overcome this problem, the optical proximity correction (OPC) is effective. This phenomenon is observed in the conventional illumination as well as the other super resolution technique. Thus, we developed the OPC system. Using the parallel processing system, we can correct the memory device data in about 2 days. The active region reduction due to the optical diffraction was preferably compensated by the OPC system. Therefore, the OPC system can be applied to the practical use. The OPC system is applicable to the super resolution. Consequently, the applicability of the super resolution technique is significantly enhanced.!18
机译:摘要:为了支持下一代ULSI设备,开发了一些超级分辨率技术。超分辨率技术对于较小的图案是有效的,但不是更大的模式。这是因为由于图案特征,所以最佳剂量改变。但是,Z图像简档具有足够的焦距。为了克服这个问题,光学邻近校正(OPC)是有效的。在传统的照明以及其他超分辨率技术中观察到这种现象。因此,我们开发了OPC系统。使用并行处理系统,我们可以在大约2天内纠正内存设备数据。由于光学衍射引起的有源区减少优选地通过OPC系统补偿。因此,OPC系统可以应用于实际使用。 OPC系统适用于超分辨率。因此,超分辨率技术的适用性显着提高了。!18

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