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Light-induced metastable defects or light-induced metastable H atoms in a-Si:H films?

机译:a-Si:H薄膜中的光诱导亚稳缺陷或光诱导亚稳H原子?

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In hydrogenated amorphous silicon (a-Si:H) films,the increase of the metastable defect density under high-intensity illumination is usually described by an empirical two-parameter stretched-exponential time dependence (characteristic time tau )_SE and dispersion parameter beta ).In this study,a clearly different (one-parameter) analytic function is obtained from a microscopic model based on the formation of metastable H (MSH) atoms in a-Si:H films.Assuming that MSH atoms are the only mobile species,only three chemical reactions are significant: MSH are produced from doubly hydrogenated (SiH HSi) configurations and trapped either at broken bounds or Si-H creation (LIC) of defects.Competition between trapping sites results in a saturation of N(t) at a steady-state value N_SS.A one-parameter fit of this analytical function to experimental data is generally good,indicating that the use of a statistical distribution of trap energies is not necessary.
机译:在氢化非晶硅(a-Si:H)薄膜中,高强度照明下亚稳态缺陷密度的增加通常由经验的两参数拉伸指数时间相关性(特征时间tau __SE和色散参数β)来描述在这项研究中,基于在a-Si:H膜中形成亚稳H(MSH)原子的微观模型,获得了明显不同的(单参数)解析函数。假设MSH原子是唯一的可移动物种,只有三个化学反应是重要的:MSH是由双氢化(SiH HSi)构型产生的,并被捕获在断裂的边界处或缺陷的Si-H产生(LIC)中。捕获位点之间的竞争导致N(t)处于饱和状态。稳态值N_SS。此分析函数与实验数据的单参数拟合通常很好,这表明不需要使用陷阱能的统计分布。

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