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Low-Temperature Plasma Deposition of Diamond-like Carbon and III Nitride Thin-Films for Photovoltaic Devices

机译:用于光伏器件的类金刚石碳和三氮化三氮薄膜的低温等离子体沉积

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摘要

Low-temperature plasma deposition of diamond-like carbon (DLC) and gallium nitride thin-films grown on Si substrate by PECVD was investigated using atomic force microscopy and reflectance spectra for photovoltaic devices application. It was found that the morphological features of the GaN film depend on the substrates under the optimum deposition conditions. The optical band gap of the films was approximately 5.5eV for PECVD DLC and approximately 3.3 eV for PECVD GaN.
机译:利用原子力显微镜和反射光谱研究了在PE衬底上通过PECVD在Si衬底上生长的类金刚石碳(DLC)和氮化镓薄膜的低温等离子体沉积。发现在最佳沉积条件下,GaN膜的形态特征取决于衬底。对于PECVD DLC,薄膜的光学带隙约为5.5eV,对于PECVD GaN,薄膜的光学带隙约为3.3eV。

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