Commercially Designed and Manufactured SDRAM SEE Data

机译：商业设计和制造的SDRAM SEE数据

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Abstract-- A commercially designed and manufactured 512Mb SDRAM is Single Event Latchup (SEL) immune and 100 krad(Si) TID tolerant. It is packaged for application use into both a 2.5Gb and a 3Gb MCM configuration [1]. The Single Event Effects (SEE) performance is reported.

机译：摘要-商业设计和制造的512Mb SDRAM具有单事件闩锁（SEL）免疫能力和100 krad（Si）TID耐受性。它被打包为2.5Gb和3Gb MCM配置供应用程序使用[1]。报告了单事件效果（SEE）性能。

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《2010 IEEE Radiation Effects Data Workshop》|2010年|p.5-5|共1页
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Hafer Craig; Von Thun Matthew; Leslie Mike; Sievert Fred; Jordan Anthony;
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中图分类无线电技术;
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Commercially Designed and Manufactured SDRAM SEE Data

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