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首页> 外文会议>SPIE Medical Imaging Conference >Imaging Performance of CMOS and a-Si:H Flat-Panel Detectors for C-Arm Fluoroscopy and Cone-Beam CT
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Imaging Performance of CMOS and a-Si:H Flat-Panel Detectors for C-Arm Fluoroscopy and Cone-Beam CT

机译：用于C臂荧光检查和锥束CT的CMOS和a-Si：H平板探测器的成像性能

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Purpose: CMOS detectors are a potentially advantageous sensor technology for indirect-detection flat-panel detectors (FPDs), offering finer pixel pitch, faster frame rate, and lower electronic noise compared to a-Si:H sensors. This work presents a preliminary analysis of the 2D and 3D imaging performance of both detector technologies. Methods: Two mobile C-arms were equipped with CMOS (Xineos 3030HS) and a-Si:H (PaxScan 3030X) FPDs. Technical assessment includes measurement of spatial resolution (MTF), image noise (NPS), and detective quantum efficiency (DQE). Evaluation of CBCT performance considers soft tissue visibility including axial image MTF, NPS, and noise-equivalent quanta (NEQ). Results: The CMOS detector exhibited lower readout noise and slightly higher spatial resolution as expected. The a-Si:H detector showed about 10-15% higher DQE at low spatial frequencies while the CMOS detector showed greater resilience in DQE at higher spatial frequencies. In matched resolution CBCT, both detectors showed roughly equivalent performance. Conclusion: CMOS detectors benefit performance with respect to high-frequency tasks, but the current work did not demonstrate strong advantage with respect to low-contrast soft-tissue visualization, in part due to light losses in scintillator-semiconductor coupling. Additional advantages include improved frame rate (reduced CBCT scan time). Ongoing work includes further investigation of modified bandwidth filters to take better advantage of underlying noise-resolution properties.
机译：目的：CMOS检测器是用于间接检测平板检测器（FPD）的潜在优势传感器技术，与a-Si：H传感器相比，它提供更好的像素间距，更快的帧频和更低的电子噪声。这项工作对两种检测器技术的2D和3D成像性能进行了初步分析。方法：两个移动式C型臂均配备了CMOS（Xineos 3030HS）和a-Si：H（PaxScan 3030X）FPD。技术评估包括空间分辨率（MTF），图像噪声（NPS）和探测量子效率（DQE）的测量。 CBCT性能的评估考虑了软组织的可见性，包括轴向图像MTF，NPS和等效噪声的量子（NEQ）。结果：CMOS检测器表现出较低的读出噪声和预期的略高的空间分辨率。 a-Si：H检测器在低空间频率下显示出大约10-15％的DQE，而CMOS检测器在较高空间频率下显示出更大的DQE弹性。在匹配分辨率的CBCT中，两个检测器均表现出大致相同的性能。结论：CMOS检测器在高频任务方面的性能有所提高，但是当前的工作在低对比度软组织可视化方面并未显示出强大的优势，部分原因是闪烁体与半导体之间的光损耗。其他优点包括改进的帧速率（减少了CBCT扫描时间）。正在进行的工作包括进一步研究修改后的带宽滤波器，以更好地利用潜在的噪声分辨率属性。

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