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Infrared scanning using radiance vs. temperature calibration techniques to determine actual temperature of an electronic component

机译:使用光线与温度校准技术的红外扫描确定电子元件的实际温度

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It is necessary to understand the limitations of an automated InfraRed (IR) system when using it for temperature measurements. These systems correct for emissivity of the test sample by heating the unpowered sample and taking radiance measurements at two temperatures. For the specific sample that was analyzed, the temperature of the area of interest of the powered sample was higher than the two temperatures used for emissivity correction. This resulted in a significant error in the temperature calculated by the system. The use of direct radiance measurements provided an accurate measurement of the sample temperature.
机译:有必要了解自动红外(IR)系统在使用时进行温度测量的局限性。这些系统通过加热无动力的样品来校正测试样品的发射率,并在两个温度下采取光线测量。对于分析的特定样品,动力样本的感兴趣区域的温度高于用于发射率校正的两个温度。这导致系统计算的温度有显着误差。使用直接辐射测量提供了对样品温度的精确测量。

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