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Controlled Growth of Zinc Oxide Nanorod Array in Aqueous Solution by Zinc Oxide Sol-gel Thin Film in Relation to Growth Rate and Optical Property

机译:氧化锌溶胶 - 凝胶薄膜与生长速率和光学性质的水溶液中氧化锌纳米棒阵列的增长

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Our work provides a systematic study of controllable morphology, crystallinity and photoluminescence (PL) of ZnO nanorod array. Our investigation demonstrates that the pretreatment conditions of the ZnO sol-gel thin-film have strong influences on the morphology, crystalline and PL of the ZnO nanorod arrays grown thereon. The annealing temperature of the sol-gel thin film plays an important role on the microstructure of the ZnO grains and then the growth of the ZnO nanorod arrays. As the annealing temperature increases from 130 to 900°C, the grain size of the thin films increases, and the diameter of thereon ZnO nanorod arrays increases from 60 to 250nm. The scanning electron microscopy image show that the growth rate of ZnO nanorod along c-axis direction is very sensitive to the size of ZnO grains, and then influences the PL peak at 380nm. The thin film annealed at the low temperature of 130°C is amorphous, but the thereon nanorod arrays are high-quality single crystals growing along the c-axis direction with a high consistent orientation perpendicular to the substrates. The as-syhthesized ZnO nanorod arrays via all solution-based processing enable the fabrication of next-generation nano-devices at low temperature.
机译:我们的作品提供了一种系统研究了ZnO Nanorod阵列的可控形态,结晶度和光致发光(PL)。我们的研究表明,ZnO溶胶 - 凝胶薄膜的预处理条件对在其上生长的ZnO纳米棒阵列的形态,晶体和PL的强烈影响。溶胶 - 凝胶薄膜的退火温度在ZnO晶粒的微观结构上起重要作用,然后在ZnO纳米座阵列的生长上起重要作用。随着退火温度从130增加到900℃,薄膜的粒度增加,并且ZnO纳米座的直径从60到250nm增加。扫描电子显微镜图像表明,ZnO纳米棒沿着C轴方向的生长速率对ZnO晶粒的尺寸非常敏感,然后在380nm处影响PL峰值。在130℃的低温下退火的薄膜是无定形的,但是纳米棒阵列是沿着C轴方向生长的高质量单晶,其具有高一致的取向垂直于基板。通过所有基于溶液的处理的AS-Syhthesized ZnO纳米座阵列使得能够在低温下制造下一代纳米器件。

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