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首页> 外文会议>International Conference on Solid State Crystals >Spectrally resolved thermoluminescence data analysis by surface fitting
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Spectrally resolved thermoluminescence data analysis by surface fitting

机译：通过表面配件分辨热致发光数据分析

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Typical analysis of thermoluminescence (TL) data is based on various curve fitting algorithms. Older methods used merely several characteristic points of TL curves as the peak position, inflection points or peak width. This approach is generally not suitable for advanced TL measurements utilizing simultaneous detection of wavelength and intensity of the emitted light. These data are represented in the form of surface in three dimensional coordinates. Spectrally resolved thermoluminescence (TL-3D) contains a lot of information concerning both trapping and recombination states. This new technique requires a novel theoretical approach for extracting from experimental data as much information as possible. In this paper we present new algorithm that we call the 'surface fitting.' TL-3D surface is numerically deconvoluted for individual peaks corresponding to trap levels and recombination centres. To demonstrate possibilities of the method we applied the algorithm to the analysis of TL-3D data of some thermoluminescence detectors based on LiF:Mg luminophor.
机译：热敏发光（TL）数据的典型分析基于各种曲线拟合算法。较旧的方法仅使用TL曲线的几个特征点作为峰位置，拐点或峰宽。这种方法通常不适用于利用发射光的波长和强度的同时检测的高级TL测量。这些数据以三维坐标的表面的形式表示。光谱分辨的热致发光（TL-3D）含有关于捕获和重组状态的大量信息。这种新技术需要一种新颖的理论方法，可以尽可能多地从实验数据提取。在本文中，我们呈现了我们称之为“表面配件”的新算法。对于对应于陷阱水平和重组中心的单个峰，TL-3D表面具有数值折杂。为了证明该方法的可能性，我们将该算法应用于基于LIF的一些热致发光探测器的TL-3D数据的分析：Mg光学摩擦。

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