首页> 外文会议>MRS Meeting >Growth of quaternary AlInGaN/GaN Heterostructures by Plasma Induced Molecular Beam Epitaxy with high In Concentration
【24h】

Growth of quaternary AlInGaN/GaN Heterostructures by Plasma Induced Molecular Beam Epitaxy with high In Concentration

机译:血浆诱导分子束外延季季季蒽仑/ GaN异质结构的生长

获取原文

摘要

Growth of AlInGaN/GaN heterostructures on sapphire substrates was achieved by plasma induced molecular beam epitaxy. Different alloy compositions were obtained by varying the growth temperature with constant Al, In, Ga and N fluxes. The In content in the alloy, measured by Rutherford Backscattering Spectroscopy, increased from 0.4% to 14.5% when the substrate temperature was decreased from 775 to 665°C. X-Ray reciprocal space maps of asymmetric AlInGaN (2.05) reflexes were used to measure the lattice constants and to verify the lattice match between the quaternary alloy and the GaN buffer layers.
机译:通过等离子体诱导的分子束外延实现了蓝宝石底物上的alingan / GaN异质结构的生长。通过用恒定的Al,In,Ga和N助熔剂改变生长温度来获得不同的合金组合物。通过Rutherford反向散射光谱测量的合金中的含量从775℃下降到665℃时从0.4%增加到14.5%。使用不对称的Alingan(2.05)反射的X射线往复式空间图用于测量晶格常数并验证季合金和GaN缓冲层之间的格子匹配。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号