X-RAY POWDER DIFFRACTION ANALYSIS OF LIQUID-PHASE-SINTERED SILICON CARBIDE CERAMICS

机译：液相烧结碳化硅陶瓷X射线粉末衍射分析

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In an attempt to gain a comprehensive understanding of the microstructural evolution in liquid-phase-sintered silicon carbide ceramics, the effect of the starting β-SiC powder has been studied. Pellets of two different β-SiC starting powders were sintered with simultaneous additions of Al_2O_3 and Y_2O_3 at 1950°C for 1 hour in flowing argon atmosphere. Here we have used X-ray diffraction to obtain the relative abundance of the resulting SiC polytypes after sintering. The significant influence of the defects concentration on the β to α transformation rate has been determined using the Rietveld method.

机译：在尝试全面了解液相烧结碳化硅陶瓷中的微观结构演化，已经研究了起始β-SiC粉末的效果。两种不同的β-SiC起始粉末的颗粒在1950℃下同时加入Al_2O_3和Y_2O_3在流动的氩气氛中加入1小时。在这里，我们使用X射线衍射在烧结后获得所得SiC多型的相对丰度。使用RIETVELD方法确定了缺陷浓度对β至α转化率的显着影响。

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《Conference exhibition of the European Ceramic Society》|2002年||共4页
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A.L. Ortiz; F. Sanchez-Bajo; F.L. Cumbrera;
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中图分类玻璃、陶瓷;
关键词
silicon carbide; liquid-phase sintering; X-ray diffraction; rietveld method;

机译：碳化硅;液相烧结;X射线衍射;RIETVELD方法;

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1. X-RAY POWDER DIFFRACTION ANALYSIS OF LIQUID-PHASE- SINTERED SILICON CARBIDE CERAMICS [J] . A.L. Ortiz, F. Sanchez-Bajo, F.L. Cumbrera Key Engineering Materials . 2002,第期

机译：液相烧结碳化硅陶瓷的X射线粉末衍射分析
2. X-ray powder diffraction analysis of a silicon carbide-based ceramic [J] . A.L. Ortiz, F. Sdnchez-Bajo, F.L. Cumbrera Materials Letters . 2001,第2期

机译：碳化硅基陶瓷的X射线粉末衍射分析
3. R-curve analysis of solid-phase-sintered and liquid-phase-sintered silicon carbide ceramics by indentation fracture and indentation-strength-in-bending methods [J] . Yang Xiao, Liu Xuejian, Wang Lujie, CERAMICS INTERNATIONAL . 2016,第3期

机译：压痕骨折和压痕强度 - 弯曲方法的固相烧结和液相烧结碳化硅陶瓷的R曲线分析
4. X-RAY POWDER DIFFRACTION ANALYSIS OF LIQUID-PHASE-SINTERED SILICON CARBIDE CERAMICS [C] . A.L. Ortiz, F. Sanchez-Bajo, F.L. Cumbrera Conference exhibition of the European Ceramic Society . 2002

机译：液相烧结碳化硅陶瓷X射线粉末衍射分析
5. Beyond FIT2D: Calculating Intensity Errors for Data Analysis of X-Ray Synchrotron Powder Diffraction Data. [D] . Sims, Melissa. 2014

机译：超越FIT2D：计算X射线同步加速器粉末衍射数据数据分析的强度误差。
6. Quantitative Determination of Hydrate Content of Theophylline Powder by Chemometric X-ray Powder Diffraction Analysis [O] . Makoto Otsuka, Hajime Kinoshita 2010

机译：化学计量X射线粉末衍射法定量测定茶碱粉中的水合物含量
7. Structural Characterization of a Coarsegrained Transparent Silicon Carbide Powder by a Combination of Powder Diffraction Techniques [O] . Peplinski, B., Fitch, A. N., Evans, A., 2009

机译：结合粉末衍射技术对粗粒透明碳化硅粉进行结构表征
8. Quantitative powder x-ray diffraction analysis of the Li2O-SiO2 glass-ceramic system. [R] . D. W. Tomlin D. B. Sullenger J. S. Cantrel 1991

机译：Li2O-siO2玻璃陶瓷体系的定量粉末X射线衍射分析。

X-RAY POWDER DIFFRACTION ANALYSIS OF LIQUID-PHASE-SINTERED SILICON CARBIDE CERAMICS

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