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Progress in molecular markers characterization for phasic development genes in wheat

机译:小麦分子标记表征的分子标志性

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Wheat is cultivated in a wide range of agro-climatic regions due to its ability for adaptation to diverse environmental conditions. The wide adaptation of wheat is controlled by many genetic factors; among which vernalization response genes (Vrn) have a major role in determining the spring and winter habit; whreas photoperiod sensitivity genes (Ppd) determine the daylight sensitivity. Using bulked segegant analysis (BSA) with two single chromosome recombinant line populations; we have attempted to identify molecular markers associated with Ppd-BI; located on chromosome 5B and a VmA-2 gene located on chromosome 7A. AFLP markers flanking the Ppd-BI were identified at 7.4 cM and 4.8cM. The closest AFLP marker identified for VmA-2 was at 16.3cM.
机译:由于其适应各种环境条件的能力,小麦在各种农业气候区域栽培。小麦的广泛适应由许多遗传因素控制;其中vernalization反应基因(VRN)在确定春季和冬季习惯方面具有重要作用; WHREAS光周期敏感基因(PPD)确定日光敏感性。用两种单一染色体重组线群体使用膨胀地震分析(BSA);我们试图识别与PPD-BI相关的分子标记;位于染色体5B和位于7A染色体上的VMA-2基因。侧翼PPD-BI的AFLP标记在7.4cm和4.8cm处鉴定。鉴定为VMA-2的最近的AFLP标记为16.3cm。

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