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The Purification of Single-Walled Carbon Nanotubes studied by X-ray induced Photoelectron Spectroscopy

机译:X射线诱导光电子谱研究的单壁碳纳米管的纯化

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Using x-ray induced photoelectron spectroscopy (XPS) we compare the purification of Single-Walled Carbon Nanotubes (SWCNTs) through oxidizing treatments, namely either nitric acid (HNO_3) or a combined oxidation in air / hydrochloric acid (HCl)-etch. We find that in the raw material the catalyst metals are covered by amorphous carbon and are exposed by oxidation in air. The catalyst metals are then removed by the HCl etch. After the HNO_3-treatment no catalyst metals are observed, indicating that amorphous carbon and catalyst metals are removed in a one step process. Both acid treatments lead to p-type doped material. In both cases p-doping doping is removed by mild annealing (≈ 330°C). For the nitric acid treatment part of the sample is doped n-type, which is stable upon annealing.
机译:使用X射线诱导光电子谱(XPS),我们通过氧化处理将单壁碳纳米管(SWCNTS)的纯化进行比较,即硝酸(HNO_3)或空气/盐酸(HCl) - 蚀刻中的组合氧化。我们发现,在原料中,催化剂金属被非晶碳覆盖,并通过空气中的氧化暴露。然后通过HCl蚀刻除去催化剂金属。在HNO_3治疗后,未观察到催化剂金属,表明在一步法中除去无定形碳和催化剂金属。两种酸处理导致p型掺杂材料。在两种情况下,通过轻度退火(≈330℃)除去p掺杂掺杂。对于硝酸处理部分样品的掺杂N型,在退火时是稳定的。

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