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NANOSCALE CONTACT LINE VISUALIZATION BASED ON TOTAL INTERNAL REFLECTION FLUORESCENCE MICROSCOPY

机译:基于全内反射荧光显微镜的纳米级接触线可视化

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This paper describes a measurement method developed to study near-wall contact line dynamics of a droplet at nanoscale level. The method is based on Total Internal Reflection Fluorescence Microscopy which uses an evanescent excitation field produced by total internal reflection of light. The penetration depth of the evanescent field depends on the angle of the incident light, meaning that for different angles (beyond the critical angle) different penetration depths can be obtained. This is used to obtain information along the optical axis, though calibration of this penetration depth is necessary. For this, an atomic force microscope equipped with a particle-attached probe is used to calibrate for intensity versus distance along the optical axis. Together with the penetration depth and the intensity distribution along the planar shape of the interface, the interface of the droplet at the nanoscale can be determined. The evanescent wave rapidly decreases in intensity, while the camera noise remains at a constant level. This means that the accuracy of the surface determination also decreases with surface height, and can be overcome by using multiple TIR angles for a single measurement, to enhance the dynamic range of the method.
机译:本文介绍了一种用于研究纳米级水平的液滴近壁接触线动力学的测量方法。该方法基于全内反射荧光显微镜,其使用通过光的全内部反射产生的渐逝激励场。渐逝场的渗透深度取决于入射光的角度,这意味着对于不同的角度(超出临界角度)可以获得不同的穿透深度。这用于获得沿光轴的信息,但是必要的校准这种穿透深度。为此,配备有粒子附着探针的原子力显微镜用于沿着光轴校准强度与距离。与沿界面的平面形状的穿透深度和强度分布在一起,可以确定纳米级液滴的界面。渐变波的强度快速降低,而相机噪声保持在恒定水平。这意味着表面测定的精度也随表面高度而减小,并且可以通过使用多个TIR角度来克服用于单个测量的多个TIR角度来增强方法的动态范围。

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