首页> 外文会议>International Conference on Advanced Ceramics and Composites >FABRICATION OF SILICON NITRIDE MULTI-WALLED NANOTUBE COMPOSITES BY DIRECT IN-SITU GROWTH OF NANOTUBES ON SILICON NITRIDE PARTICLES
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FABRICATION OF SILICON NITRIDE MULTI-WALLED NANOTUBE COMPOSITES BY DIRECT IN-SITU GROWTH OF NANOTUBES ON SILICON NITRIDE PARTICLES

机译:通过直接原位生长在氮化硅颗粒上的纳米管直接生长制造氮化硅多壁组合材料

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In this research, Silicon Nitride (Si_3N_4)-Carbon Nanotube (CNT) composites were fabricated by direct in-situ growth of CNTs on the Si_3N_4 mixtures using Chemical Vapor Depositon (CVD) followed by Spark Plasma Sintering (SPS). The SPS technique used to sinter these powders is characterized by high heating and cooling rates coupled with pressure which prevents grain coarsening and also allows for densification in a very short period of time compared to the conventional sintering methods. The CVD techniques for in - situ CNT growth ensures a more uniform dispersion in the matrix than traditional ex-situ CNT mixing methods. The sintered samples were analyzed using Field Emission Scanning Electron Microscopy (FEGSEM), X Ray Diffraction (XRD), Raman Spectroscopy and High Resolution Transmission Electron Microscopy (HRTEM). FEGSEM analysis of the Si_3N_4-CNT powders show uniform distribution of multi-walled nanotubes (MWNTs) in the matrix without the formation of bundles seen with traditional ex-situ mixing of CNTs in ceramic compositions. FEGSEM analysis of the fractured surface shows a uniform distribution of CNTs in the ceramic matrix. The presence of CNTs in the matrix is confirmed by Raman Spectroscopy and HRTEM. The Si_3N_4-MWNT composite thus fabricated shows a more uniform distribution of CNTs in the matrix and excellent CNT retention after sintering at 1850°C. FEGSEM analysis shows a finer grain size due to the presence of CNTs at grain boundaries which inhibit the diffusion related grain growth.
机译:在该研究中,通过使用化学蒸气床(CVD)直接原位生长的CNTs在Si_3N_4混合物上直接原位生长进行氮化硅(Si_3N_4) - 碳纳米管(CNT)复合材料,然后通过火花等离子体烧结(SPS)。用于烧结这些粉末的SPS技术的特征在于,高加热和冷却速率与压力相结合,其防止晶粒粗化并且与传统烧结方法相比,在非常短的时间内允许致密化。用于原位CNT生长的CVD技术可确保基质中比传统的前所CNT混合方法更均匀的分散。使用现场发射扫描电子显微镜(FEGSEM),X射线衍射(XRD),拉曼光谱和高分辨率透射电子显微镜(HRTEM)分析烧结样品。 Si_3N_4-CNT粉末的FEGSEM分析显示在基质中的多壁纳米管(MWNTS)的均匀分布,而无需在陶瓷组合物中形成CNT的传统出原位混合所看到的束。裂缝表面的FEGSEM分析显示陶瓷基质中CNT的均匀分布。通过拉曼光谱和HRTEM确认基质中CNT的存在。如此制造的Si_3N_4-MWNT复合材料显示出在基质中的CNT和在1850℃下烧结后的优异CNT保留的更均匀的CNT保留。 FEGSEM分析显示了由于谷物边界的CNTS存在的细粒尺寸,抑制扩散相关的晶粒生长。

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