首页> 外文会议>European Photovoltaic Solar Energy Conference >COMPARISON OF INDOOR AND OUTDOOR PERFORMANCE MEASUREMENTS ON AMORPHOUS SILICON AND MICROMORPH (a-Si/μc-Si) LARGE-AREA THIN FILM SOLAR MODULES
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COMPARISON OF INDOOR AND OUTDOOR PERFORMANCE MEASUREMENTS ON AMORPHOUS SILICON AND MICROMORPH (a-Si/μc-Si) LARGE-AREA THIN FILM SOLAR MODULES

机译:无定形硅和微晶体(A-Si /μC-Si)大面积薄膜太阳能模块的室内和室外性能测量比较

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In the present work we compare outdoor and indoor performance measurements of two sets of thin film large-area (> 1m~2) modules: 1) single-junction a-Si and 2) tandem a-Si/μc-Si. For the single-junction device, the indoor measurement with a pulsed solar simulator - after mismatch factor (MMF) correction - underestimates the P_(max) by 3.3% compared to the outdoor measured P_(max) (also MMF corrected), whereas for the tandem device the indoor measurements overestimates the P_(max) by 4.9%. For the single-junction modules the discrepancy is within the measurement uncertainty of our measurement set-ups, whereas for tandem devices the discrepancy between indoor and outdoor slightly exceeds the calculated measurement uncertainty valid for standard devices. However, our calculation of measurement uncertainties did neither take sweep speed effects into account nor did it consider the uncertainties arising in the special case of tandem devices, due to current mismatch. Sweep-time measurements show the influence of the IV scan speed and direction on the measured FF, and therefore on P_(max). According to our results flashers with a pulse duration of 1.5 ms are not sufficient and at least 10 ms should be used to test these devices in a laboratory. The discrepancies in the measurement of short circuit current (I_(sc)) for both set of devices may originate from uncertainties in the calculation of the MMF correction. Moreover, for tandem devices the spectral mismatch correction is not yet standardized, but in one approach each junction is treated as a separate device. Although a larger temperature range is accepted for the outdoor performance measurement a relatively good match between indoor and outdoor measurements is obtained for V_(oc). These results will form the basis for the performance measurement of large-area multi-junction devices at ESTI and the development of a calibration procedure for tandem devices.
机译:在本工作中,我们比较两组薄膜大面积(> 1M〜2)模块的室外和室内性能测量:1)单结A-Si和2)串联A-Si /μC-Si。对于单结装置,与脉冲太阳模拟器 - 失配因子(MMF)校正后的室内测量 ​​- 与室外测量的P_(MAX)(也是MMF校正)相比,低估了P_(最大)3.3%,而用于串联设备室内测量值高估P_(最大值)4.9%。对于单结模块,差异在测量设置的测量不确定性范围内,而对于串联设备,室内和室外之间的差异超过计算出对标准设备有效的计算的测量不确定性。然而,我们对测量不确定性的计算既没有考虑扫描速度效应,也没有考虑由于当前的不匹配而在串联装置的特殊情况下产生的不确定性。扫描时间测量显示IV扫描速度和方向对测量的FF的影响,因此在P_(MAX)上。根据我们的结果,脉冲持续时间为1.5毫秒的闪光灯不足,至少应使用至少10毫秒来在实验室中测试这些设备。两组设备的短路电流(I_(SC))测量的差异可能来自计算MMF校正的计算中的不确定性。此外,对于串联设备,光谱失配校正尚未标准化,但是在一种方法中,每个结被处理为单独的装置。尽管在室内性能测量中接受较大的温度范围,但是为V_(OC)获得室内和室外测量之间的相对良好的匹配。这些结果将为ESTI的大面积多结装置的性能测量和串联装置的校准程序的开发形成基础。

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