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首页> 外文会议>IEEE International Symposium on Design and Diagnostics of Electronic Circuits Systems >A Rare Event Based Yield Estimation Methodology for Analog Circuits
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A Rare Event Based Yield Estimation Methodology for Analog Circuits

机译：基于罕见的模拟电路的产量估计方法

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With the growing use of analog circuits in sensor systems for internet of things applications, estimation of their yield has become critical in order to increase the efficiency of large volume manufacturing. In this paper, a methodology to estimate the yield of analog circuits beyond 95% is proposed. The methodology is based on an algorithm that uses adaptive sampling to approach the “tail” region of the initial distribution which contains the dysfunctional units. These units do not satisfy the initial design targets thereby lowering the yield. An inverter and a two-stage operational amplifier have been used to verify the methodology where the reference distribution is based on 10^6 samples for both circuits. Simulation results reveal that the accuracy for 95%, 98%, and 99% yield has been compromised by less than 2.1%, 5.7%, and 7.4%, respectively, whereas the computation cost is reduced by 20x.
机译：随着在传感器系统中使用模拟电路的越来越多，估计其产量已经变得至关重要，以提高大批量生产的效率。在本文中，提出了一种估计超过95 ％超过95 ％的模拟电路产量的方法。该方法基于一种算法，该算法使用自适应采样来接近包含功能函数单位的初始分布的“尾”区域。这些单元不满足初始设计目标，从而降低产量。逆变器和两级运算放大器已被用于验证参考分布基于10 ^ 6个样品的电路的方法。仿真结果表明，95 ％，98 ％和99 ％收益率的精度分别损害了小于2.1 ％，5.7 ％和7.4 ％，而计算成本降低了20倍。

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