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首页> 外文会议>21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems >A Rare Event Based Yield Estimation Methodology for Analog Circuits
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A Rare Event Based Yield Estimation Methodology for Analog Circuits

机译：基于稀有事件的模拟电路良率估算方法

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摘要

With the growing use of analog circuits in sensor systems for internet of things applications, estimation of their yield has become critical in order to increase the efficiency of large volume manufacturing. In this paper, a methodology to estimate the yield of analog circuits beyond 95% is proposed. The methodology is based on an algorithm that uses adaptive sampling to approach the “tail” region of the initial distribution which contains the dysfunctional units. These units do not satisfy the initial design targets thereby lowering the yield. An inverter and a two-stage operational amplifier have been used to verify the methodology where the reference distribution is based on 10^6 samples for both circuits. Simulation results reveal that the accuracy for 95%, 98%, and 99% yield has been compromised by less than 2.1%, 5.7%, and 7.4%, respectively, whereas the computation cost is reduced by 20x.
机译：随着模拟电路在物联网应用的传感器系统中的日益普及，对它们的成品率的估计已变得至关重要，以提高大批量制造的效率。在本文中，提出了一种方法来估算超过95％的模拟电路的成品率。该方法基于一种算法，该算法使用自适应采样来逼近包含功能失调的单元的初始分布的“尾部”区域。这些单元不满足最初的设计目标，从而降低了成品率。反相器和两级运算放大器已用于验证方法的参考分配基于两个电路的10 ^ 6采样的方法。仿真结果表明，对于95％，98％和99％的产率，精度分别降低了不到2.1％，5.7％和7.4％，而计算成本却降低了20倍。

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