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首页> 外文会议>International Symposium of the Society of Core Analysts >MEASUREMENT PARAMETERS AND RESOLUTION ASPECTS OF MICRO X-RAY TOMOGRAPHY FOR ADVANCED CORE ANALYSIS
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MEASUREMENT PARAMETERS AND RESOLUTION ASPECTS OF MICRO X-RAY TOMOGRAPHY FOR ADVANCED CORE ANALYSIS

机译：微X射线断层扫描的测量参数和分辨率方面进行高级核心分析

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摘要

Micro X-ray Tomography(μ-XCT)is an emerging non-destructive imaging technology with large potential for application in advanced core analysis.This scanning technique provides 3-D images and quantitative information in the micron range,i.e.at pore scale level.μ-XCT will assist to gain fundamental insight on rock topology structure,in-situ physicochemical processes as well as grain contacts and micro-fractures.Especially in the Carbonate arena(e.g.,Middle East),where pore structures are extremely complex,μ-XCT can provide a step change in our understanding of multi-phase flow properties of rock.The knowledge gained will lead to more accurate scaling relationships between micro-and macro-(field)scales enabling better estimation of hydrocarbon recovery.Tabletop μ-XCT scanners are envisaged to provide optimal flexibility for advanced core analysis research.In this paper we discuss the various measurement parameters that play a role in μ-XCT.Signal-to-noise ratio and spatial resolution are considered as the most important parameters for μ-XCT.Some results will be presented of an assessment study towards the performance capabilities of a number of tabletop μ-XCT scanners.In this study different reservoir carbonate rock samples as well as synthetic rock samples have been used.The spatial resolution of current commercial tabletop μ-XCT scanners is in the order of 5-8 microns,which is not sufficient to probe micro pores for carbonate rock.We have also considered technical innovations to enhance the spatial resolution in tabletop μ-XCT.Possibly the spatial resolution in μ-XCT can be improved using nano-focus X-ray sources with sub-micron focal spot.Further improvement in spatial resolution is expected from using emerging tabletop laser plasma X-ray technology.For applications in tight carbonates,synchrotron beam line based μ-XCT offers spatial resolutions below 1 micron.
机译：微X射线断层扫描（μ-XCT）是一种新兴的非破坏性成像技术，具有在先进的核心分析中的应用潜力大。此扫描技术在微米范围内提供3-D图像和定量信息，IEAT孔隙率水平。 μ-xct将有助于获得岩石拓扑结构，原位物理化学过程以及谷物接触和微骨折的基本洞察力。高度在碳酸盐竞技场（例如中东），其中孔结构非常复杂，μ- XCT可以在我们对岩石的多相流特性的理解中提供一步变化。所获得的知识将导致微型和宏（现场）尺度之间的更准确的缩放关系，从而能够更好地估计Fourtocaropact.Tabletopμ-XCT扫描仪设想为高级核心分析研究提供最佳的灵活性。在本文中，我们讨论了在μ-xct中发挥作用的各种测量参数。信号到噪声比和空间分辨率是C作为μ-xct最重要的参数。将介绍一些桌面μ-xct扫描仪的性能能力的评估研究。这项研究不同的储层碳酸盐岩样以及合成岩石样品使用的空间分辨率μ-XCT扫描仪的5-8微米的顺序，这对碳酸盐岩石探测微孔不足。我们还考虑了技术创新，以提高桌面μ-的空间分辨率μ- XCT.Possige可以使用具有亚微米焦点的纳米聚焦X射线源来改善μ-XCT中的空间分辨率。预计使用新出现的桌面激光等离子体X射线技术预期空间分辨率的提高。在紧密的应用碳酸盐基，同步梁线基μ-XCT提供低于1微米的空间分辨率。

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