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High-resolution smile measurement and control of wavelength-locked QCW and CW laser diode bars

机译:波长锁定QCW和CW激光二极管条的高分辨率微笑测量和控制

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High-power linewidth-narrowed applications of laser diode arrays demand high beam quality in the fast, or vertical, axis. This requires very high fast-axis collimation (FAC) quality with sub-mrad angular errors, especially where laser diode bars are wavelength-locked by a volume Bragg grating (VBG) to achieve high pumping efficiency in solid-state and fiber lasers. The micron-scale height deviation of emitters in a bar against the FAC lens causes the so-called smile effect with variable beam pointing errors and wavelength locking degradation. We report a bar smile imaging setup allowing FAC-free smile measurement in both QCW and CW modes. By Gaussian beam simulation, we establish optimum smile imaging conditions to obtain high resolution and accuracy with well-resolved emitter images. We then investigate the changes in the smile shape and magnitude under thermal stresses such as variable duty cycles in QCW mode and, ultimately, CW operation. Our smile measurement setup provides useful insights into the smile behavior and correlation between the bar collimation in QCW mode and operating conditions under CW pumping. With relaxed alignment tolerances afforded by our measurement setup, we can screen bars for smile compliance and potential VBG lockability prior to assembly, with benefits in both lower manufacturing costs and higher yield.
机译:激光二极管阵列的高功率线宽狭窄的应用在快速或垂直,轴上需要高光束质量。这需要具有具有子Mrad角误差的非常高的快速轴准直(FAC)质量,特别是在激光二极管杆被音量布拉格光栅(VBG)上波长锁定,以在固态和光纤激光器中实现高泵送效率。靠近FAC镜片的条形中发射器的微米级高度偏差导致可变光束指向误差和波长锁定劣化的所谓的微笑效果。我们报告了QCW和CW模式中允许无缝笑容测量的酒吧微笑成像设置。通过高斯光束仿真,我们建立了最佳的微笑成像条件,以获得高分辨率和准确性,具有良好的解析器图像。然后,我们在QCW模式下的热应力下调查微笑形状和幅度的变化,并且最终是CW操作。我们的笑脸测量设置为QCW模式和CW泵送下的QCW模式和操作条件之间的笑脸行为和相关性提供了有用的见解。通过我们的测量设置提供放松的对准公差,我们可以在装配之前筛选微笑合规性和潜在的VBG可抵抗力,以及较低的制造成本和更高收益率。

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