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Use of the optical quadrature method in tomographic microscopy

机译:使用光学正交方法在断层显微镜中

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The optical quadrature imaging technique, as derived and extended from microwave and laser radar quadrature detection techniques, provides an efficient method for obtaining phase information from a sample that has little or no amplitude contrast. We are able to resolve internal structures of a sample that are defined by relatively small refractive index differences without the use of dyes or stains, while using much lower light levels than conventional techniques. We have constructed a prototype system for imaging microscopic phase- only objects. In this paper, we present its capabilities, as well as the imaging and reconstruction methods used to obtain quantitative information about a sample.
机译:从微波和激光雷达正交检测技术导出和延伸的光学正交成像技术提供了从具有很少或没有幅度对比度的样本获得相位信息的有效方法。我们能够解析在不使用染料或污渍的情况下通过相对较小的折射率差异定义的样本的内部结构,同时使用比传统技术更低的光线水平。我们构建了用于成像微观阶段对象的原型系统。在本文中,我们提出了其能力,以及用于获得关于样本的定量信息的成像和重建方法。

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