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Measurement of the orbit fluctuation caused by an insertion device with the amplitude modulation method

机译:用幅度调制方法的插入装置引起的轨道波动测量

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We have developed a new method to extract only the orbit fluctuation caused by changing magnetic field error of an insertion device (ID). This method consists of two main parts. (i) The orbit fluctuation is measured with modulating the error field of the ID by using the real-time beam position measuring system. (ii) The orbit fluctuation depending on the variation of the error field of the ID is extracted by the filter applying the Wavelet Transform. We call this approach the amplitude modulation method. This analysis technique was applied to measure the orbit fluctuation caused by the error field of APPLE-2 type undulator (ID23) installed in the SPring-8 storage ring. We quantitatively measured two kinds of the orbit fluctuation which are the static term caused by the magnetic field error and the dynamic term caused by the eddy current on the ID23 chamber.
机译:我们开发了一种仅通过改变插入装置(ID)的磁场误差而引起的轨道波动的新方法。该方法包括两个主要部分。 (i)通过使用实时光束位置测量系统调制ID的误差场测量轨道波动。 (ii)根据施加小波变换的滤波器提取根据ID的误差场的变化的轨道波动。我们称之为幅度调制方法。应用该分析技术来测量由安装在弹簧8存储环中的Apple-2型起伏器(ID23)的误差场引起的轨道波动。我们定量测量了两种轨道波动,这是由磁场误差引起的静态术语和由ID23室内的涡电流引起的动态术语。

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