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Effects of SiO_2 Substitution on Piezoelectric and Mechanical Properties of PMS-PZT Ternary Piezoelectric Ceramics

机译:SiO_2取代对PMS-PZT三元压电陶瓷压电和力学性能的影响

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The effects of SiO_2 additives on microstructure, piezoelectric and mechanical properties were investigated for Pb_(0.98)Sr_(0.02)(Mn_(1/3)Sb_(2/3))_(0.05)Zr_(0.48)Ti_(0.47)O_3 (PMS-PZT) ternary system close to the morpho-tropic phase boundary. Piezoelectric coefficient (d_(33)) and electromechanical coupling factor (K_p) considerably deteriorated with the substitution of SiO_2 increased. On the other hand, the mechanical quality factor (Q_m) increased, the maximum value was 1800. Fracture strength of 1.0 wt% SiO_2 added the specimens reached to 106.54 MPa which was about 1.4 times higher than pure PMS-PZT ceramic. The rapid improvement of fracture strength probably due to the decrease of grain size, pore distribute and the second phase (redundant Si~(4+) ions) segregating on the grain boundary which enhanced the bond energy of grain boundary. The optimized concentration of SiO_2 doped PMS-PZT ceramics was 0.4 wt% for high power application: d_(33) = 300 PC/N, K_p = 0.51, Q_m = 1500, tanδ = 0.32% and the fracture strength was 88.5MPa.
机译:上的微结构,压电性能和机械性能SiO_2添加剂的影响进行了调查Pb_(0.98)SR_(0.02)(MN_(1/3)Sb_(2/3))_(0.05)Zr_(0.48)TI_(0.47)O_3 (PMS-PZT)三元体系接近吗啉嗜相界。与SiO_2的取代显着劣化的压电系数(D_(33))和机电耦合系数(K_p)增加。另一方面,机械品质因子(Q_m)增加,最大值为1.0%(重量)1800断裂强度SiO_2加入达到106.54兆帕试样,其约高1.4倍,比纯PMS-PZT陶瓷。的断裂强度可能是由于粒度的减小而迅速改善,孔分布和晶界,其增强的晶界的键能在第二阶段(冗余的Si〜(4+)离子)分离。 SiO_2的优化的浓度掺杂的PMS-PZT陶瓷为0.4%(重量)用于高功率应用:D_(33)= 300 PC / N,K_p = 0.51,Q_m = 1500,tanδ的= 0.32%,断裂强度为88.5MPa。

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