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Tuning Absolute Band Gap of Silicon Photonic Crystals by Atomic Layer Deposition (ALD) Interfacial Layers

机译:用原子层沉积调节硅光子晶体的绝对带隙(ALD)界面层

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We modeled the two dimensional photonic crystal consisting of air cylinders in silicon background by using plane wave expansion method. In this particular structure, the absolute band gap can be tuned only in a small range of normalized radii (0.404-0.48). Within this range, the band gap changes rapidly with the air cylinder radius due to the high dielectric constant of silicon. In addition, we modeled the structures with interfacial layers of Al{sub}2O{sub}3 and SiO{sub}2 deposited by atomic layer deposition (ALD). As the thickness of the deposited layer varies from 0 to 0.05a (a=lattice constant), the band gap changes respectively by 3.7% and 2.5% for Al{sub}2O{sub}3 and SiO{sub}2. For a photonic crystal of lattice constant 400nm, the interfacial layer thickness is equivalent to 20nm, which is well within the scale that can be accurately controlled by ALD. Therefore, fine tuning of photonic band gap can be achieved by ALD.
机译:我们通过使用平面波扩建方法建模了由硅背景中的气缸组成的二维光子晶体。在这种特定的结构中,绝对带隙可以仅在常规的归一化半径范围内进行调谐(0.404-0.48)。在该范围内,带隙由于硅的高介电常数而随空气滚筒半径而变化。另外,我们用沉积由原子层沉积(ALD)沉积的Al {sub} 2o {sub} 3和siO {sub} 2的界面层的结构。由于沉积层的厚度从0变化到0.05A(A =晶格常数),并且对于Al {Sub} 2O} 3和SIO {Sub} 2,带隙分别变化分别为3.7%和2.5%。对于晶格常数400nm的光子晶体,界面层厚度相当于20nm,这在可以通过ALD精确控制的尺度内。因此,可以通过ALD实现光子带隙的微调。

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