High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces

机译：高分辨率扫描电子和原子力显微镜：观察沸石表面上的纳米特征

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It is now possible to observe nanometer features on the surfaces of zeolitic materials using high-resolution scanning electron microscopy. By taking ibidem measurements in combination with atomic force microscopy we are able to illustrate the strengths and weaknesses of both techniques and judge respective resolving power.

机译：现在可以使用高分辨率扫描电子显微镜观察沸石材料表面上的纳米特征。通过与原子力显微镜相结合的Ibidem测量，我们能够说明两种技术和判断各自的解决能力的强度和弱点。

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《International Federation of European Zeolite Associations Conference》|2008年||共6页
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作者
Sam Michael Stevens; Kjell Jansson; Neena S. John;
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正文语种
中图分类物理化学（理论化学）、化学物理学;
关键词
HRSEM; AFM; Ibidem; Zeolite A; STA-7;

机译：HRSEM;AFM;IBIDEM;沸石A;STA-7;

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1. Details of Surface Features in Aromatic Polyamide Reverse Osmosis Membranes Characterized by Scanning Electron and Atomic Force Microscopy [J] . KWAK SEUNG-YEOP, JUNG SOO GYUNG, YOON YOUNG SEO, Journal of Polymer Science, Part A. Polymer Chemistry . 1999,第13期

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2. Details of Surface Features in Aromatic Polyamide Reverse Osmosis Membranes Characterized by Scanning Electron and Atomic Force Microscopy [J] . Seung-Yeop Kwak, Soo Gyung Jung, Young Seo Yoon, Journal of Polymer Science, Part B. Polymer Physics . 1999,第13期

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3. Atomic Force Microscopy and High Resolution Scanning Electron Microscopy Investigation of Zeolite A Crystal Growth. Part 2: in Presence of Organic Additives [J] . Pablo Cubillas, J ames T. Gebbie, Sam M. Stevens The journal of physical chemistry, C. Nanomaterials and interfaces . 2014,第40期

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4. High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces [C] . Sam Michael Stevens, Kjell Jansson, Neena S. John International Federation of European Zeolite Associations Conference . 2008

机译：高分辨率扫描电子和原子力显微镜：观察沸石表面上的纳米特征
5. Studies of surface interactions at nanometer scale with atomic force microscopy combined with scanning electron microscopy. [D] . Ho, Huddee Jacob. 1997

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6. Atomic Structures of Silicene Layers Grown on Ag(111): Scanning Tunneling Microscopy and Noncontact Atomic Force Microscopy Observations [O] . Andrea Resta, Thomas Leoni, Clemens Barth, -1

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7. Artifacts related to tip asymmetry in high-resolution atomic force microscopy and scanning tunneling microscopy measurements of graphitic surfaces [O] . Uluutku B., Baykara M.Z. 2015

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8. Scanning Tunneling Microscopy and Atomic Force Microscopy Characterization ofPolystyrene Spin-Coated onto Silicon Surfaces [R] . Stange, T. G., Mathew, R., Evans, D. F., 1992

机译：扫描隧道显微镜和原子力显微镜表征聚苯乙烯旋涂在硅表面上

High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces

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