Reflection High Energy Electron Diffraction (RHEED) Study of Nanostructures: From Diffraction Patterns to Surface Pole Figures

机译：纳米结构的反射高能量电子衍射（RHEED）研究：从衍射图形到表面极图

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In this report we present a brief overview of the growth of nanostructures by the oblique angle deposition where the nanostructures possess both out-of-plane and in-plane preferred orientations or a biaxial texture.. The degree of preferred crystal orientations can be quantitatively determined from a method called "RHEED surface pole figure analysis" that we developed recently.

机译：在本报告中，我们通过倾斜角沉积介绍纳米结构的生长，其中纳米结构具有外平面外和面内优选的取向或双轴纹理。可以定量地确定优选的晶体取向程度从一个名为“Rheed Surface极点图分析”的方法，我们最近开发。

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《Symposium GG on Electron Crystallography for Materials Research and Quantitative Characterization of Nanostructured Materials》|2009年||共6页
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Fu Tang; Ton-Ming Lu; Gwo-Ching Wang;
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专利

1. In situ reflection high energy electron diffraction surface pole figure study of biaxial texture evolution in anisotropic Mg nanoblades during shadowing growth [J] . F.Tang, G.-C. Wang, T.-M. Lu Journal of Applied Physics . 2007,第1期

机译：阴影生长过程中各向异性Mg纳米叶片双轴织构演化的原位反射高能电子衍射表面极图研究
2. Surface pole figures by reflection high-energy electron diffraction [J] . F. Tang, G.-C. Wang, T.-M. Lu Applied Physics Letters . 2006,第24期

机译：反射高能电子衍射的表面极图
3. Report on the Studies of the Surfaces of Chemical-Vapor-Deposited (CVD) Thin Diamond Films Conducted by Reflection High-Energy Electron Diffraction (RHEED), Atomic Force Microscopy (AFM), and Scanning Tunneling Microscopy (STM) [J] . Tomohide TAKAMI 東北大学科学計測研究所報告 . 2001,第1期

机译：通过反射高能电子衍射（RHEED），原子力显微镜（AFM）和扫描隧道显微镜（STM）进行化学气相沉积（CVD）金刚石薄膜表面研究的报告
4. Reflection High Energy Electron Diffraction (RHEED) Study of Nanostructures: From Diffraction Patterns to Surface Pole Figures [C] . Fu Tang, Ton-Ming Lu, Gwo-Ching Wang Symposium GG on Electron Crystallography for Materials Research and Quantitative Characterization of Nanostructured Materials . 2009

机译：纳米结构的反射高能量电子衍射（RHEED）研究：从衍射图形到表面极图
5. Characterization of MBE Grown Metal, Semiconductor and Superconductor Films and Interfaces by Concurrent Use of In Situ Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Energy Loss Spectroscopy (REELS) [D] . Strawbridge, Brett William 2012

机译：通过同时使用原位反射高能电子衍射（RHEED）和反射电子能量损失谱（REELS）来表征MBE生长的金属，半导体和超导体薄膜和界面
6. In situ Control of Si/Ge Growth on Stripe-Patterned Substrates Using Reflection High-Energy Electron Diffraction and Scanning Tunneling Microscopy [O] . B Sanduijav, G Springholz 2010

机译：利用反射高能电子衍射和扫描隧道显微镜原位控制条形衬底上Si / Ge的生长
7. Reflection High-Energy Electron Diffraction (RHEED) Dynamical Theory and the Application for Adsorption and Dynamic Processes on Crystal Surfaces [O] . Ayahiko ICHIMIYA 2010

机译：反射高能电子衍射（RHEED）动力学理论及其在晶体表面上吸附和动态过程的应用
8. Time-Resolved Surface Structural Study by Picosecond Reflection High-Energy Electron Diffraction. [R] . Elsayed, H. E. 1989

机译：皮秒反射高能电子衍射的时间分辨表面结构研究。

Reflection High Energy Electron Diffraction (RHEED) Study of Nanostructures: From Diffraction Patterns to Surface Pole Figures

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