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Performance analysis of 20 nm gate length Fin-FET for different materials and fin-widths

机译:不同材料和翅片宽度20nm栅极长度翅片FET的性能分析

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Scaling is the most important demand of current scenario as the device technology changes day by day. The channel length of field effect transistors has reduced from micrometers to tens of nanometers. However, lot of limitation and defects are increases with scaling down the device dimensions such as short channel effect, reliability and variability effects issues. To overcome this type of problems related to scaling, new transistor configuration have to be investigated. FinFET is the promising doublegate or tri-gate transistor configuration to extend scaling over planar device. Multiple gates device have better control over the short channel effect. A double gate Fin field effect transistor can reduce Drain Induced Barrier Lowering (D1BL) and improve threshold voltage (short channel effects). In this paper, an important work function geometrical parameter is discussed using Visual TCAD. The transfer characteristics of the FinFET at different fin widths have been acquired at a supply voltage of 0.1V. T he comparison is made at different Fin-widths. It is observe that, at larger Fin-widths the drain current is increases in comparison to shorter fin widths.
机译:缩放是当前场景的最重要需求,因为设备技术日复一日地发生变化。场效应晶体管的通道长度从微米到数十纳米减少。然而,大量的限制和缺陷随着诸如短信效应,可靠性和可变性效应问题的设备尺寸而增加,缩放缩小。为了克服与缩放相关的这种类型的问题,必须研究新的晶体管配置。 FINFET是有前途的双通或三栅极晶体管配置,以延长平面装置的缩放。多个栅极设备更好地控制短信效果。双栅极翅片场效应晶体管可以减少漏极感应屏障降低(D1BL)并提高阈值电压(短沟道效应)。在本文中,使用Visual TCAD讨论了一个重要的工作函数几何参数。已经以0.1V的电源电压获取不同翅片宽度以不同翅片宽度的FinFET的传递特性。比较在不同的翅片宽度上进行比较。观察到,在较大的翅片宽度下,与鳍片宽度相比,漏极电流增加。

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