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Improvement of the image analysis methods in the surface elemental analysis based on the scanning probe microscopy: XANAM

机译：基于扫描探针显微镜的表面元素分析中的图像分析方法的改进：Xanam

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We proposed a surface elemental analysis of chemically sensitive noncontact atomic force microscopy (NC-AFM) combined with the synchrotron radiation (SR) X-ray techniques, named as "X-ray aided noncontact atomic force microscopy (XANAM).” The basic concept for XANAM is based on the fact which we found in the previous study.

机译：我们提出了化学敏感的非接触原子力显微镜（NC-AFM）的表面元素分析，与同步辐射（SR）X射线技术相结合，命名为“X射线辅助非接触原子力显微镜（Xanam）”。 Xanam的基本概念基于我们在前一项研究中发现的事实。

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来源
《日本化学会春季年会講演予稿集》|2018年|1 CD-ROM|共1页
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Shushi Suzuki; Shingo Mukai; Wang Jae Chun;
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正文语种
中图分类石油化学工业;
关键词
Surface elemental analysis; Synchrotron Radiation X-ray; Noncontact atomic force microscopy; nickel;

机译：表面元素分析;同步辐射X射线;非接触原子力显微镜;镍;

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专利

1. Development of a Novel Surface Elemental Analysis Methodology: X-ray-Aided Noncontact Atomic Force Microscopy (XANAM) [J] . Suzuki Shushi Bulletin of the Chemical Society of Japan . 2015,第2期

机译：新型表面元素分析方法的发展：X射线辅助非接触原子力显微镜（Xanam）
2. Enhanced feature analysis using wavelets for scanning probe microscopy images of surfaces [J] . Alisher Maksumov, Ruxandra Vidu, Ahmet Palazoglu, Journal of Colloid and Interface Science . 2004,第2期

机译：使用小波的增强特征分析，用于扫描表面的探针显微镜图像
3. Elemental and chemical microanalysis of silicon surfaces by reflected electron energy loss microscopy and scanning Auger microscopy [J] . E. Paparazzo Journal of Electron Spectroscopy and Related Phenomena . 1995,第期

机译：反射电子能量损失显微镜和扫描俄歇显微镜对硅表面进行元素和化学显微分析
4. Improvement of the image analysis methods in the surface elemental analysis based on the scanning probe microscopy: XANAM [C] . Shushi Suzuki, Shingo Mukai, Wang Jae Chun 日本化学会春季年会講演予稿集 . 2018

机译：基于扫描探针显微镜的表面元素分析中的图像分析方法的改进：Xanam
5. Control-systems based analysis and design methods for scanning probe microscopy. [D] . Lee, Chi bum. 2010

机译：基于控制系统的扫描探针显微镜分析和设计方法。
6. Utility of Scanning Electron Microscopy Elemental Analysis Using the ‘NanoSuit’ Correlative Light and Electron Microscopy Method in the Diagnosis of Lanthanum Phosphate Deposition in the Esophagogastroduodenal Mucosa [O] . Kazuya Shinmura, Hideya Kawasaki, Satoshi Baba, 2020

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7. The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images [O] . G.T. Martinez, A. De Backer, A. Rosenauer, 2014

机译：探头不准确对大角度环形暗场扫描透射电子显微镜图像定量模型分析的影响
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机译：使用扫描电子显微镜/能量色散光谱（sEm / EDs）方法分析附着在地毯纤维表面的小颗粒，作为以独立于制造的Chara的方式测试痕量证据的关联的手段

Improvement of the image analysis methods in the surface elemental analysis based on the scanning probe microscopy: XANAM

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