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Improvement of the detection sensitivity of edxrf trace element analysis by means of efficient x-ray focusing based on strongly curved hopg crystals

机译:基于强弯曲跳跃晶体的高效X射线聚焦,通过高效X射线聚焦改善EDXRF痕量元素分析的检测灵敏度

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X-ray focusing based on Bragg reflection at curved crystals allows collection of a large solid angle of incident radiation, monochromatization of this radiation, and condensation of the beam reflected at the crystal into a small spatial cross-section in a pre-selected focal plane. Thus, for the Bragg reflected radiation, one can achieve higher intensities that for the radiation passing directly to the same small area in the focal plane. In that case one can profit considerably from X-ray focusing in an EDXRF arrangement.
机译:基于弯曲晶体的布拉格反射的X射线聚焦允许收集大型的入射辐射角,该辐射的单色化,以及在晶体中反射的光束的冷凝在预选的焦平面中的小空间横截面中 。 因此,对于布拉格反射辐射,可以实现更高的强度,使辐射直接通过焦平面中的相同小区域。 在这种情况下,人们可以从X射线专注于EDXRF布置的情况下盈利。

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