RIETVELD REFINEMENT OF LiCoO2-TYPE LAYERED STRUCTURES: SEMI-QUANTITATIVE ANALYSIS OF Li CONTENTS

机译：LietVeld精制LiCoO2型分层结构：LI内容的半定量分析

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Rietveld refinement of Li_xCoO_2-type cathodes has been demonstrated to yield semi-quantitative information about the Li occupancy with an error of about ～10%. With careful XRD data collection, refinement, and proper calibration, accurate values can be obtained. Rietveld refinement tends to under-predict the Li occupancy values in charged (de-lithiated) cathodes as compared to ICP measurements. A Li-gradient model that assumes a decreasing concentration of Li from the particle core to its surface is discussed to explain this observation.

机译：已经证明了LI_XCOO_2型阴极的RIETVELD细化，以产生关于LI占用的半量值信息，误差约为约10％。通过仔细的XRD数据收集，细化和适当的校准，可以获得精确的值。与ICP测量相比，RIETVELD改进倾向于预测带电（去锂化）阴极中的LI占用值。讨论了假设从颗粒芯降低到其表面的Li浓度的Li-梯度模型以解释该观察。

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《Annual conference on applications of X-ray analysis》|2002年||共6页
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Mark A. Rodriguez; David Ingersoll; Daniel H. Doughty;
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中图分类 X射线、紫外线、红外线;
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2. Averaging the intensity of many-layered structures for accurate stacking-fault analysis using Rietveld refinement [J] . Coelho Alan A., Evans John S. O., Lewis James W. Journal of Applied Crystallography . 2016,第5期

机译：使用Rietveld优化对多层结构的强度求平均以进行准确的堆叠故障分析
3. Structural analysis of layered Li2MnO3-LiMO2 (M=Ni1/3Mn1/3Co1/3, Ni1/2Mn1/2) cathode materials by Rietveld refinement and first-principles calculations [J] . Song Liubin, Tang Zhaohui, Chen Yang, CERAMICS INTERNATIONAL . 2016,第7期

机译：通过Rietveld精细化和第一性原理计算的层状Li2MnO3-LiMO2（M = Ni1 / 3Mn1 / 3Co1 / 3，Ni1 / 2Mn1 / 2）正极材料的结构分析
4. RIETVELD REFINEMENT OF LiCoO2-TYPE LAYERED STRUCTURES: SEMI-QUANTITATIVE ANALYSIS OF Li CONTENTS [C] . Mark A. Rodriguez, David Ingersoll, Daniel H. Doughty Annual conference on applications of X-ray analysis . 2002

机译：LietVeld精制LiCoO2型分层结构：LI内容的半定量分析
5. Structure and elasticity of sodium magnesium fluoride and calcium iridium oxide at high pressures and temperatures---The perovskite and post-perovskite structure model of magnesium silicate investigated with Rietveld structure refinement and ultrasonic interferometry. [D] . Martin, Charles David. 2007

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7. Averaging the intensity of many-layered structures for accurate stacking-fault analysis using Rietveld refinement. [O] . Coelho A.A., Evans J.S.O., Lewis J.W. 2016

机译：使用Rietveld精修对多层结构的强度进行平均，以进行准确的堆叠故障分析。

RIETVELD REFINEMENT OF LiCoO2-TYPE LAYERED STRUCTURES: SEMI-QUANTITATIVE ANALYSIS OF Li CONTENTS

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