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ANGULAR PROPERTIES OF Xe+-SPUTTERED MOLYBDENUM AT LOW IMPINGEMENT ENERGY

机译:低冲击能量XE + -SPUTTED钼的角度

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The angular properties of sputtered molybdenum have not been previously measured for impinging ions with energy below 1 keV. The 0.2 – 1 keV energy range is very relevant for currently operational gridded ion thrusters, and exhibits high dependence on angles of incidence and emission as well as incident energy. To address this problem, the Doppler profiles and relative density of molybdenum atoms sputtered from a small, rotatable target by an independently rotatable ion source were determined by laser-induced fluorescence, the first study of its type for the molybdenum element. The profiles were obtained for various emission angles about the target normal as well as for multiple angles of incidence, and ion impingement energies of 250 and 550 eV. The velocity distributions obtained at each incidence angle, field angle, and beam energy were well-fitted to a Thompson distribution. The fittingparameter trends are discussed with reference to angles of incidence and emission, and the impingement energy.
机译:之前未测量溅射钼的角度,以便将离子撞击到1keV以下的能量。 0.2 - 1 keV能量范围对于目前的运营包装离子推进器非常相关,并且对发病率和排放的角度以及事件能量具有高依赖性。为了解决这个问题,通过激光诱导的荧光测定通过独立旋转的离子源从小型可旋转靶溅射的多普勒曲线和钼原子的相对密度由激光诱导的荧光确定其钼元素的第一研究。对于围绕目标正常的各种排放角以及多个入射角,以及250和550eV的离子冲击能量,获得了曲线。在每个入射角,场角度和光束能量上获得的速度分布良好地适合于汤普森分布。参考发射角度和排放角度以及冲击能量讨论配合参数趋势。

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