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A Series Association Model For Double Gate Graded-Channel SOI nMOSFET Analog Circuit Simulation

机译:双栅极渐变沟道SOI nMOSFET模拟电路仿真的系列关联模型

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摘要

In this work we present the development of an equivalent series association analytical model for double gate (DG) Silicon-on-Insulator (SOI) nMOSFET transistor with graded-channel (GC) that is valid from weak inversion to strong inversion. Through the use of DG analytical models available in the literature, considering an equivalent structure represented by two transistors with different doping levels in series association, with short-circuited gates, each one simulating a GC channel region, we have got a model of the DG GC SOI nMOSFET. Atlas numerical two-dimensional simulations and experimental results are used to validate the proposed model. Good agreement between simulated, modelled and experimental results is found.
机译:在这项工作中,我们介绍了具有渐变沟道(GC)的双栅极(DG)绝缘体上硅(SOI)nMOSFET晶体管的等效串联关联分析模型的开发,该模型在从弱反转到强反转都有效。通过使用文献中可用的DG分析模型,考虑由串联关联的具有不同掺杂水平的两个晶体管代表的等效结构,以及具有短路的栅极,每个栅极模拟一个GC通道区域,我们得到了DG的模型GC SOI nMOSFET。使用Atlas数值二维仿真和实验结果来验证所提出的模型。在模拟,建模和实验结果之间找到了很好的一致性。

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  • 会议地点 Gramado(BR);Gramado(BR);Gramado(BR);Gramado(BR);Gramado(BR);Gramado(BR)
  • 作者单位

    Department of Electrical Engineering Centro Universitario da FEI Av. Humberto de A. C. Braneo n° 3972 09850-901 - Sao Bernardo do Campo - Brazil;

    Seccion de Electronica del Estado Solido (SEES) Av. IPN 2508, Apto. Postal 14-740, 07300 DF, Mexico;

    Department of Electrical Engineering Centro Universitario da FEI Av. Humberto de A. C. Braneo n° 3972 09850-901 - Sao Bernardo do Campo - Brazil LSI/PSI/USP, University of Sao Paulo Av. Prof. Luciano Gualberto, trav. 3 n° 158 - 05508-900 - Sao Paulo - Brazil;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 微电子学、集成电路(IC);
  • 关键词

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