Considerations about Interconnection Effects in Basic Single-Electron Circuits

机译：关于基本单电子电路中互连效应的考虑

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In this work, an investigation about the interconnection effects in single-electron circuits is carried out by simulation. Circuit models for interconnections are presented, considering different materials, areas and lengths. Furthermore, a possible solution for decreasing the interconnect effects is proposed.

机译：在这项工作中，通过仿真研究了单电子电路中的互连效应。提出了用于互连的电路模型，其中考虑了不同的材料，面积和长度。此外，提出了降低互连效应的可能解决方案。

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《Microelectronics Technology and Devices-SBMicro 2008》|2008年|447-456|共10页
会议地点 Gramado(BR);Gramado(BR);Gramado(BR);Gramado(BR);Gramado(BR);Gramado(BR)
作者
V. G. A. Carneiro; T. G. Scandaroli; J. G. Guimaraes; J. C. da Costa;
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作者单位

Department of Electrical Engineering, University of Brasilia, Campus Universitario, Asa Norte, C.P. 4386, Brasilia - DF, 70919-970, Brasil;

Department of Electrical Engineering, University of Brasilia, Campus Universitario, Asa Norte, C.P. 4386, Brasilia - DF, 70919-970, Brasil;

Department of Electrical Engineering, University of Brasilia, Campus Universitario, Asa Norte, C.P. 4386, Brasilia - DF, 70919-970, Brasil;

Department of Electrical Engineering, University of Brasilia, Campus Universitario, Asa Norte, C.P. 4386, Brasilia - DF, 70919-970, Brasil;

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原文格式 PDF
正文语种 eng
中图分类微电子学、集成电路（IC）;
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Considerations about Interconnection Effects in Basic Single-Electron Circuits

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