Enhanced Site specific Preparation of SEM Cross Sections and TEM Samples byusing CrossBeam Technology

机译：使用CrossBeam技术增强特定位置的SEM横截面和TEM样品的制备

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来源
《Microscopy Society of America annual meeting;Microscopy Society of Canada annual meeting;Societe de Microscopie du Canada annual meeting;Microbeam Analysis Society annual meeting;International Metallographic Society annual meeting》|2002年|1-2|共2页
会议地点 Quebec City(CA);Quebec City(CA);Quebec City(CA);Quebec City(CA);Quebec City(CA)
作者
P. Gnauck; P. Hoffrogge; M. Schumann; G. Bauhammer;
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作者单位

LEO Elektronenmikroskopie GmbH, Oberkochen, Germany;

LEO Elektronenmikroskopie GmbH, Oberkochen, Germany;

LEO Elektronenmikroskopie GmbH, Oberkochen, Germany;

LEO Elektronenmikroskopie GmbH, Oberkochen, Germany;

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原文格式 PDF
正文语种 eng
中图分类观察、分析晶体结构的实验方法;
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Enhanced Site specific Preparation of SEM Cross Sections and TEM Samples byusing CrossBeam Technology

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