TEM Analysis of Fe_3O_4/GaAs Hybrid Ferromagnet/Semiconductor Nanostructures

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• 来源
  《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》|2012年|1632-1633|共2页
• 会议地点 Phoenix AZ(US)
• 作者

  Sahar Hihath; Paul M. Riechers; Andrew Thron; Jun Chen; Christopher B. Murray; Richard A. Kiehl; Klaus van Benthem;

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• 作者单位

  Department of Electrical and Computer Engineering, University of California, Davis, CA;

  rnDepartment of Electrical and Computer Engineering, University of California, Davis, CA;

  rnDepartment of Materials Science and Engineering, University of California, Davis, CA;

  rnDepartment of Materials Science and Engineering, University of Pennsylvania, Philadephia, PA;

  rnDepartment of Materials Science and Engineering, University of Pennsylvania, Philadephia, PA;

  rnDepartment of Electrical and Computer Engineering, University of California, Davis, CA;

  rnDepartment of Materials Science and Engineering, University of California, Davis, CA;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类
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