A hyperspectral scanning microscope system for phenomenology support

机译：用于现象学支持的高光谱扫描显微镜系统

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Three hyperspectral imaging systems have been implemented as microscopic hyperspectral imagers to support phenomenology studies at high spatial resolution. Wavelength ranges are VNIR (500 to 1000 run), SWIR (1000 ran to 2500 nm) and LWIR (7 to 14 microns). The spatial resolution of the system at all wavelengths is 30 microns and covers a field of view of 8x30 mm. Samples are illuminated by rings of halogen lights and IR emitters for reflectance measurements and at thermal wavelengths can also be measured in thermal emission. Data are calibrated by scans of gold or Spectralon reflectance standards, and a flat plate blackbody for thermal emission measurements.

机译：三种高光谱成像系统已被实现为显微高光谱成像仪，以支持高空间分辨率的现象学研究。波长范围是VNIR（500到1000行程），SWIR（1000到2500 nm）和LWIR（7到14微米）。系统在所有波长下的空间分辨率均为30微米，覆盖8x30 mm的视场。样品被卤素灯和红外发射器的环照亮，以进行反射率测量，并且还可以在热波长下测量热发射。数据通过扫描金或Spectralon反射率标准品以及用于热发射测量的平板黑体进行校准。

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来源
《Next-Generation Spectroscopic Technologies X》|2017年|102100k.1-102100k.5|共5页
会议地点 Anaheim(US)
作者
Paul G. Lucey; Jessica Norman; Sarah T. Crites;
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作者单位

University of Hawaii at Manoa, 1680 East West Road, Honolulu, HI, USA 96822;

University of Hawaii at Manoa, 1680 East West Road, Honolulu, HI, USA 96822;

Japan Aerospace Exploration Agency, Institute of Space and Astronautical Science, Tokyo Japan;

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原文格式 PDF
正文语种 eng
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关键词
hyperspectral; microscope; particulate;

机译：高光谱显微镜;颗粒状;

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4. A hyperspectral scanning microscope system for phenomenology support [C] . Paul G. Lucey, Jessica Norman, Sarah T. Crites Conference on Next-Generation Spectroscopic Technologies X . 2017

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A hyperspectral scanning microscope system for phenomenology support

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